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STM32F103R4T7TR 参数 Datasheet PDF下载

STM32F103R4T7TR图片预览
型号: STM32F103R4T7TR
PDF下载: 下载PDF文件 查看货源
内容描述: 基于ARM的低密度高性能线的32位MCU,具有16或32 KB闪存, USB , CAN ,6个定时器, 2的ADC ,6个通信接口 [Low-density performance line, ARM-based 32-bit MCU with 16 or 32 KB Flash, USB, CAN, 6 timers, 2 ADCs, 6 communication interfaces]
分类和应用: 闪存微控制器和处理器外围集成电路通信时钟
文件页数/大小: 80 页 / 1067 K
品牌: STMICROELECTRONICS [ ST ]
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STM32F103x4, STM32F103x6  
Table 28. Flash memory characteristics (continued)  
Electrical characteristics  
Symbol  
Parameter  
Conditions  
Min(1)  
Typ  
Max(1) Unit  
Read mode  
fHCLK = 72 MHz with 2 wait  
states, VDD = 3.3 V  
20  
5
mA  
mA  
IDD  
Supply current  
Write / Erase modes  
fHCLK = 72 MHz, VDD = 3.3 V  
Power-down mode / Halt,  
50  
µA  
V
VDD = 3.0 to 3.6 V  
Vprog Programming voltage  
2
3.6  
1. Guaranteed by design, not tested in production.  
Table 29. Flash memory endurance and data retention  
Value  
Symbol  
Parameter  
Conditions  
Unit  
Min(1) Typ  
Max  
TA = –40 to +85 °C (6 suffix versions)  
TA = –40 to +105 °C (7 suffix versions)  
NEND Endurance  
kcycles  
10  
1 kcycle(2) at TA = 85 °C  
30  
10  
20  
tRET  
Data retention 1 kcycle(2) at TA = 105 °C  
Years  
10 kcycles(2) at TA = 55 °C  
1. Based on characterization, not tested in production.  
2. Cycling performed over the whole temperature range.  
5.3.10  
EMC characteristics  
Susceptibility tests are performed on a sample basis during device characterization.  
Functional EMS (electromagnetic susceptibility)  
While a simple application is executed on the device (toggling 2 LEDs through I/O ports). the  
device is stressed by two electromagnetic events until a failure occurs. The failure is  
indicated by the LEDs:  
Electrostatic discharge (ESD) (positive and negative) is applied to all device pins until  
a functional disturbance occurs. This test is compliant with the IEC 61000-4-2 standard.  
FTB: A Burst of Fast Transient voltage (positive and negative) is applied to V and  
DD  
V
through a 100 pF capacitor, until a functional disturbance occurs. This test is  
SS  
compliant with the IEC 61000-4-4 standard.  
A device reset allows normal operations to be resumed.  
The test results are given in Table 30. They are based on the EMS levels and classes  
defined in application note AN1709.  
Doc ID 15060 Rev 3  
49/80  
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