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SST36VF3204-70-4E-B3KE 参数 Datasheet PDF下载

SST36VF3204-70-4E-B3KE图片预览
型号: SST36VF3204-70-4E-B3KE
PDF下载: 下载PDF文件 查看货源
内容描述: 32兆位( X8 / X16 )并行的SuperFlash [32 Mbit (x8/x16) Concurrent SuperFlash]
分类和应用: 内存集成电路
文件页数/大小: 34 页 / 432 K
品牌: SST [ SILICON STORAGE TECHNOLOGY, INC ]
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32 Mbit Concurrent SuperFlash  
SST36VF3203 / SST36VF3204  
Data Sheet  
AC CHARACTERISTICS  
TABLE 15: READ CYCLE TIMING PARAMETERS VDD = 2.7-3.6V  
Symbol  
TRC  
Parameter  
Min  
Max  
Units  
ns  
Read Cycle Time  
70  
TCE  
Chip Enable Access Time  
Address Access Time  
70  
70  
35  
ns  
TAA  
ns  
TOE  
Output Enable Access Time  
CE# Low to Active Output  
OE# Low to Active Output  
CE# High to High-Z Output  
OE# High to High-Z Output  
Output Hold from Address Change  
RST# Pulse Width  
ns  
1
TCLZ  
0
0
ns  
1
TOLZ  
ns  
1
TCHZ  
16  
16  
ns  
1
TOHZ  
ns  
1
TOH  
0
ns  
1
TRP  
500  
50  
ns  
1
TRHR  
RST# High before Read  
RST# Pin Low to Read Mode  
ns  
1,2  
TRY  
20  
µs  
T15.1 1270  
1. This parameter is measured only for initial qualification and after a design or process change that could affect this parameter.  
2. This parameter applies to Sector-Erase, Block-Erase, and Program operations.  
This parameter does not apply to Chip-Erase operations.  
TABLE 16: PROGRAM/ERASE CYCLE TIMING PARAMETERS  
Symbol  
TBP  
Parameter  
Min  
Max  
Units  
µs  
Program Time  
10  
TAS  
Address Setup Time  
Address Hold Time  
WE# and CE# Setup Time  
WE# and CE# Hold Time  
OE# High Setup Time  
OE# High Hold Time  
CE# Pulse Width  
0
40  
0
ns  
TAH  
ns  
TCS  
ns  
TCH  
0
ns  
TOES  
TOEH  
TCP  
0
ns  
10  
40  
40  
30  
30  
30  
0
ns  
ns  
TWP  
WE# Pulse Width  
ns  
1
TWPH  
WE# Pulse Width High  
CE# Pulse Width High  
Data Setup Time  
ns  
1
TCPH  
ns  
TDS  
ns  
1
TDH  
Data Hold Time  
ns  
1
TIDA  
Software ID Access and Exit Time  
Sector-Erase  
150  
25  
25  
ns  
TSE  
TBE  
TSCE  
TES  
ms  
ms  
ms  
µs  
Block-Erase  
Chip-Erase  
50  
Erase-Suspend Latency  
RY/BY# Delay Time  
Bus Recovery Time  
10  
1,2  
TBY  
90  
ns  
1
TBR  
0
µs  
T16.1 1270  
1. This parameter is measured only for initial qualification and after a design or process change that could affect this parameter.  
2. This parameter applies to Sector-Erase, Block-Erase, and Program operations.  
This parameter does not apply to Chip-Erase operations.  
©2005 Silicon Storage Technology, Inc.  
S71270-03-000  
7/06  
18