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KFG1216U2B-SIB6 参数 Datasheet PDF下载

KFG1216U2B-SIB6图片预览
型号: KFG1216U2B-SIB6
PDF下载: 下载PDF文件 查看货源
内容描述: [Flash, 32MX16, 70ns, PBGA67]
分类和应用: 内存集成电路
文件页数/大小: 120 页 / 1551 K
品牌: SAMSUNG [ SAMSUNG ]
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OneNAND512Mb(KFG1216U2B-xIB6)  
3.10 Erase Operation  
FLASH MEMORY  
There are multiple methods for erasing data in the device including Block Erase and Multi-Block Erase.  
3.10.1 Block Erase Operation  
See Timing Diagram 6.126.12  
The Block Erase Operation is done on a block basis. To erase a block is to write all 1's into the desired memory block by executing  
the Internal Erase Routine. All previous data is lost.  
Block Erase Operation Flow Chart  
Start  
Write ’FBA’ of Flash  
Add: F100h DQ=FBA  
Write 0 to interrupt register1)  
Add: F241h DQ=0000h  
Write ’Erase’ Command  
Add: F220h DQ=0094h  
Wait for INT register  
low to high transition  
Add: F241h DQ=[15]=INT  
Read Interrupt register  
Add: F241h DQ[5]=EI  
NO  
Read Controller  
Status Register ‘Lock’ bit high  
DQ[5]=1?  
YES  
Add: F240h DQ[14]=Lock  
Read Controller  
Status Register  
Add: F240h DQ[10]=Error  
Erase Lock Error  
DQ[10]=0?  
: If erase operation results in an error, map out  
the failing block and replace it with another block.  
*
YES  
NO  
Erase completed  
Erase Error  
Note 1) ’Write 0 to interrupt register’ step may be ignored when using INT auto mode. Refer to chapter 2.8.18.1  
74  
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