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K9XXG16UXM-Y 参数 Datasheet PDF下载

K9XXG16UXM-Y图片预览
型号: K9XXG16UXM-Y
PDF下载: 下载PDF文件 查看货源
内容描述: 256M ×8位/ 128M x 16位NAND闪存 [256M x 8 Bit / 128M x 16 Bit NAND Flash Memory]
分类和应用: 闪存
文件页数/大小: 39 页 / 679 K
品牌: SAMSUNG [ SAMSUNG ]
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K9W4G08U1M  
K9K2G08Q0M  
K9K2G08U0M  
K9W4G16U1M  
K9K2G16Q0M  
K9K2G16U0M  
FLASH MEMORY  
BLOCK ERASE  
The Erase operation is done on a block basis. Block address loading is accomplished in three cycles initiated by an Erase Setup com-  
mand(60h). Only address A18 to A28(X8) or A17 to A27(X16) is valid while A12 to A17(X8) or A11 to A16(X16) is ignored. The Erase  
Confirm command(D0h) following the block address loading initiates the internal erasing process. This two-step sequence of setup  
followed by execution command ensures that memory contents are not accidentally erased due to external noise conditions.  
At the rising edge of WE after the erase confirm command input, the internal write controller handles erase and erase-verify. When  
the erase operation is completed, the Write Status Bit(I/O 0) may be checked. Figure 13 details the sequence.  
Figure 13. Block Erase Operation  
tBERS  
R/B  
"0"  
Pass  
60h  
I/O0  
Fail  
70h  
Address Input(3Cycle)  
I/Ox  
D0h  
"1"  
Block Add. : A12 ~ A28 (X8)  
or A11 ~ A27 (X16)  
READ STATUS  
The device contains a Status Register which may be read to find out whether program or erase operation is completed, and whether  
the program or erase operation is completed successfully. After writing 70h command to the command register, a read cycle outputs  
the content of the Status Register to the I/O pins on the falling edge of CE or RE, whichever occurs last. This two line control allows  
the system to poll the progress of each device in multiple memory connections even when R/B pins are common-wired. RE or CE  
does not need to be toggled for updated status. Refer to table 2 for specific Status Register definitions. The command register  
remains in Status Read mode until further commands are issued to it. Therefore, if the status register is read during a random read  
cycle, the read command(00h) should be given before starting read cycles.  
Table2. Read Staus Register Definition  
I/O No.  
I/O 0  
Page Program  
Pass/Fail  
Block Erase  
Pass/Fail  
Not use  
Cache Prorgam  
Pass/Fail(N)  
Pass/Fail(N-1)  
Not use  
Read  
Not use  
Definition  
Pass : "0"  
Fail : "1"  
Fail : "1"  
I/O 1  
Not use  
Not use  
Pass : "0"  
I/O 2  
Not use  
Not use  
Not use  
Don’t -cared  
Don’t -cared  
Don’t -cared  
Busy : "0"  
I/O 3  
Not Use  
Not Use  
Not Use  
Not Use  
I/O 4  
Not Use  
Not Use  
Not Use  
Not Use  
I/O 5  
Ready/Busy  
Ready/Busy  
Write Protect  
Ready/Busy  
Ready/Busy  
Write Protect  
True Ready/Busy  
Ready/Busy  
Write Protect  
Ready/Busy  
Ready/Busy  
Write Protect  
Ready : "1"  
Ready : "1"  
I/O 6  
Busy : "0"  
I/O 7  
Protected : "0"  
Not Protected  
I/O 8~15  
(X16 device  
only)  
Not use  
Not use  
Not use  
Not use  
Don’t -care  
NOTE : 1. True Ready/Busy represents internal program operation status which is being executed in cache program mode.  
2. I/Os defined ’Not use’ are recommended to be masked out when Read Status is being executed.  
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