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M38510/13101BPC 参数 Datasheet PDF下载

M38510/13101BPC图片预览
型号: M38510/13101BPC
PDF下载: 下载PDF文件 查看货源
内容描述: [Operational Amplifier, 1 Func, 3000uV Offset-Max, CDIP8, CERAMIC, DIP-8]
分类和应用:
文件页数/大小: 22 页 / 177 K
品牌: RAYTHEON [ RAYTHEON COMPANY ]
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MIL-M-38510/131A  
4.3 Qualification inspection. Qualification inspection shall be in accordance with MIL-PRF-38535.  
4.4 Technology Conformance inspection (TCI). Technology conformance inspection shall be in accordance with  
MIL-PRF-38535 and herein for groups A, B, C, and D inspections (see 4.4.1 through 4.4.4).  
4.4.1 Group A inspection. Group A inspection shall be in accordance with table III of MIL-PRF-38535 and as  
follows:  
a. Tests shall be as specified in table II herein.  
b. Subgroups 9, 10, and 11 shall be omitted.  
c. A special subgroup shall be added to group A inspection for class S devices only and shall consists  
of the tests, conditions, and limits of subgroup 12 as shown in table III herein.  
4.4.2 Group B inspection. Group B inspection shall be in accordance with table II of MIL-PRF-38535.  
4.4.3 Group C inspection. Group C inspection shall be in accordance with table III of MIL-PRF-38535 and as  
follows:  
a. End point electrical parameters shall be as specified in table II herein.  
b. The steady-state life test duration, test condition, and test temperature, or approved alternatives shall be as  
specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test circuit  
shall be maintained under document control by the device manufacturer's Technology Review Board (TRB)  
in accordance with MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon  
request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in  
accordance with the intent specified in test method 1005 of MIL-STD-883.  
4.4.4 Group D inspection. Group D inspection shall be in accordance with table IV of MIL-PRF-38535. End point  
electrical parameters shall be as specified in table II herein.  
4.5 Methods of inspection. Methods of inspection shall be specified and as follows.  
4.5.1 Voltage and current. All voltage values given, except the input offset voltage (or differential voltage) are  
referenced to the external zero reference level of the supply voltage. Currents given are conventional and positive  
when flowing into the referenced terminal.  
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