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SS2625Q1-10 参数 Datasheet PDF下载

SS2625Q1-10图片预览
型号: SS2625Q1-10
PDF下载: 下载PDF文件 查看货源
内容描述: [ZBT SRAM, 2MX36, 5ns, CMOS, PQFP100, TQFP-100]
分类和应用: 静态存储器内存集成电路
文件页数/大小: 30 页 / 223 K
品牌: RAMTRON [ RAMTRON INTERNATIONAL CORPORATION ]
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72Mbit Pipelined BSRAM  
w/ NoBL Architecture  
2Mx36  
Preliminary Data Sheet  
Capacitance (TA = 0°C to 70°C)  
Symbol  
CIN  
Parameter  
Min  
2.5  
3.5  
Typical  
Max  
4
Units  
pF  
Notes  
Input Capacitance  
-
-
CI/O  
Input/Output Capacitance  
6
pF  
AC Test Load  
VH --  
OUTPUT  
90%  
10%  
tL  
ALL  
INPUTS  
Z0 = 50Ω  
RL = 50  
-- VL  
VTT  
For VDD = 3.3V, AC timing tests use VL = 0V and VH = 3.0V. For VDDQ = 2.5V AC timing tests use VL = 0V and VH = 2.5V.  
In both cases, input transit time tT must be 2 ns. Input timings are referenced to (VH-VL) / 2. Output timings are  
referenced to VTT (for VDDQ = 3.3V, VTT = 1.5V and for VDDQ = 2.5V, VTT = 1.25V).  
DC Equivalent Load  
R1  
VDDQ  
For VDDQ = 2.5V  
R1 = 422  
R2 = 390  
OUTPUT  
CL = 5 pF  
R2  
For VDDQ = 3.3V  
R1 = 317  
R2 = 351  
Including  
Jig and  
Scope  
Package Thermal Characteristics  
Symbol  
θJA  
Parameter  
TQFP  
PBGA  
22  
Units  
°C/W  
°C/W  
Notes  
1, 2, 3  
2
Thermal Resistance (Junction to Ambient)  
Thermal Resistance (Junction to Case)  
25  
10  
8
θJC  
Notes:  
1. Tested in still air with device soldered to a 4.25 x 1.125 inch, 4-layer printed circuit board.  
2. Tested initially and after any design or process changes that may affect these parameters.  
3. Value accounts for thermal conduction through device leads or solder balls.  
Enhanced Memory Systems Inc., 1850 Ramtron Dr., Colo Spgs, CO 80921  
Copyright 2001 Enhanced Memory Systems. All rights reserved.  
PHONE: (800) 545-DRAM; FAX: (719) 488-9095; http://www.edram.com  
The information contained herein is subject to change without notice.  
Revision 1.0  
Page 9 of 30  
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