Internet Data Sheet
HYB25DC512[800/160]C[E/F]
512-Mbit Double-Data-Rate SDRAM
Parameter
Symbol –5
DDR400B
Min.
–6
Unit Note/ Test
Condition 1)
DDR333
Min.
Max.
Max.
2)3)4)5)10)
Write preamble setup time
Write postamble
tWPRES
tWPST
tWR
0
—
0
—
ns
tCK
ns
tCK
2)3)4)5)11)
2)3)4)5)
0.40
15
2
0.60
—
0.40
15
1
0.60
—
Write recovery time
2)3)4)5)
Internal write to read command
delay
tWTR
—
—
2)3)4)5)
Exit self-refresh to non-read
command
tXSNR
75
—
75
—
ns
2)3)4)5)
Exit self-refresh to read command tXSRD
200
—
200
—
tCK
1) 0 °C ≤ TA ≤ 70 °C; VDDQ = 2.5 V ± 0.2 V, VDD = +2.5 V ± 0.2 V (DDR333); VDDQ = 2.6 V ± 0.1 V, VDD = +2.6 V ± 0.1 V (DDR400)
2) Input slew rate ≥ 1 V/ns for DDR400, DDR333
3) The CK/CK input reference level (for timing reference to CK/CK) is the point at which CK and CK cross: the input reference level for signals
other than CK/CK, is VREF. CK/CK slew rate are ≥ 1.0 V/ns.
4) Inputs are not recognized as valid until VREF stabilizes.
5) The Output timing reference level, as measured at the timing reference point indicated in AC Characteristics (note 3) is VTT
6) For each of the terms, if not already an integer, round to the next highest integer. tCK is equal to the actual system clock cycle time.
7) HZ and tLZ transitions occur in the same access time windows as valid data transitions. These parameters are not referred to a specific
voltage level, but specify when the device is no longer driving (HZ), or begins driving (LZ).
8) Fast slew rate ≥ 1.0 V/ns , slow slew rate ≥ 0.5 V/ns and < 1 V/ns for command/address and CK & CK slew rate > 1.0 V/ns, measured
between VIH(ac) and VIL(ac)
.
t
.
9) These parameters guarantee device timing, but they are not necessarily tested on each device.
10) The specific requirement is that DQS be valid (HIGH,LOW, or some point on a valid transition) on or before this CK edge. A valid transition
is defined as monotonic and meeting the input slew rate specificationsof the device. When no writes were previously in progress on the
bus, DQS will be transitioning from Hi-Z to logic LOW. If a previous write was in progress, DQS could be HIGH, LOW at this time, depending
on tDQSS
.
11) The maximum limit for this parameter is not a device limit. The device operates with a greater value for this parameter, but system
performance (bus turnaround) degrades accordingly.
TABLE 20
IDD Conditions
Parameter
Symbol
Operating Current: one bank; active/ precharge; tRC = tRCMIN; tCK = tCKMIN
;
IDD0
DQ, DM, and DQS inputs changing once per clock cycle; address and control inputs changing once every two
clock cycles.
Operating Current: one bank; active/read/precharge; Burst = 4;
IDD1
Refer to the following page for detailed test conditions.
Precharge Power-Down Standby Current: all banks idle; power-down mode; CKE ≤VILMAX; tCK = tCKMIN
IDD2P
IDD2F
Precharge Floating Standby Current: CS ≥ VIHMIN, all banks idle;
CKE ≥ VIHMIN; tCK = tCKMIN, address and other control inputs changing once per clock cycle, VIN = VREF for DQ, DQS
and DM.
Precharge Quiet Standby Current: CS ≥ VIHMIN, all banks idle; CKE ≥ VIHMIN; tCK = tCKMIN, address and other
control inputs stable at ≥ VIHMIN or ≤ VILMAX; VIN=VREF for DQ, DQS and DM.
IDD2Q
IDD3P
Active Power-Down Standby Current: one bank active; power-down mode;
CKE ≤ VILMAX; tCK= tCKMIN; VIN = VREF for DQ, DQS and DM.
Rev. 1.3, 2006-12
26
03292006-W2FE-ELDX
QIMONDA [ QIMONDA AG ]
