MCP6271/1R/2/3/4/5
1.1
Test Circuits
The test circuits used for the DC and AC tests are
shown in Figure 1-2 and Figure 1-3. The bypass
capacitors are laid out according to the rules discussed
in Section 4.7 “Supply Bypass”.
VDD
1 µF
0.1 µF
VIN
VOUT
RL
RN
RG
MCP627X
CL
RF
VDD/2
VL
FIGURE 1-2:
AC and DC Test Circuit for
Most Non-Inverting Gain Conditions.
VDD
1 µF
0.1 µF
VDD/2
VOUT
RL
RN
RG
MCP627X
CL
RF
VIN
VL
FIGURE 1-3:
AC and DC Test Circuit for
Most Inverting Gain Conditions.
© 2008 Microchip Technology Inc.
DS21810F-page 5