W78M32VP-XBX
TABLE 31 – AC TEST CONDITIONS
Parameter
Typ
Unit
V
Input Pulse Levels
VIL - 0, VIH = 2.5
Input Rise and Fall
5
ns
V
Input and Output Reference Level
Output Timing Reference Level
1.5
1.5
V
Notes:
VZ is programmable from -2V to +7V.
IOL & IOH programmable from 0 to 16 mA.
Tester Impedance Z0 = 50
VZ is typically the midpoint of VOH and VOL.
IOL & IOH are adjusted to similate a typical resistive load circuit.
ATE tester Includes jig capacitance.
TABLE 32 – TEST SPECIFICATIONS
Test Condition
Output Load
All Speeds
Unit
1 TTL gate
Output Load Capacitance, CL (including jig capacitance)
Input Rise and Fall Times
30
5
pF
ns
V
Input Pulse Levels
0.0–VIO
0.5VIO
0.5VIO
Input timing measurement reference levels (See Note)
V
Output timing measurement reference levels
Note: If VIO < VCC, the reference level is 0.5 VIO.
V
TABLE 33 – AC CHARACTERISTICS — READ-ONLY OPERATIONS
VCC = 3.3V ± 0.3V, -55°C ≤ TA ≤ +125°C
-110
-120
Min Max
Parameter
Symbol
Unit
Min Max
Read Cycle Time
tAVAV
tAVQV
tELQV
tRC
tACC
tCE
110
120
ns
ns
ns
ns
ns
ns
ns
Address Access Time
110
120
120
25
Chip Select Access Time
Page Access Time
110
25
25
20
20
tPACC
tOE
Output Enable to Output Valid (1)
Chip Select High to Output High Z
Output Enable High to Output High Z
tOLQV
tEHQZ
tGHQZ
25
tDF
20
tDF
20
Output Hold from Addresses, CS# or OE# Change, Whichever occurs
first
tAXQX
tOH
0
0
0
0
ns
ns
ns
ns
Read
tOEH
Output Enable Hold Time
Chip Enable Hold Time
Toggle and Data#
Polling
10
35
10
35
tCEH
Note: (1) tOE for data polling is 45ns when VIO = 1.65V to 2.7V and 32ns when VIO = 2.7V to 3.6V.
Microsemi Corporation reserves the right to change products or specifications without notice.
August 2011 © 2011 Microsemi Corporation. All rights reserved.
Rev. 15
21
Microsemi Corporation • (602) 437-1520 • www.microsemi.com
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