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W3H128M72E-400NBM 参数 Datasheet PDF下载

W3H128M72E-400NBM图片预览
型号: W3H128M72E-400NBM
PDF下载: 下载PDF文件 查看货源
内容描述: [DDR DRAM, 128MX72, 1.35ns, CMOS, PBGA208, BGA-208]
分类和应用: 动态存储器双倍数据速率内存集成电路
文件页数/大小: 31 页 / 1024 K
品牌: MERCURY [ MERCURY UNITED ELECTRONICS INC ]
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W3H128M72E-XSBX / W3H128M72E-XNBX  
“sw1,” which enables all R1 values that are 150Ω each, enabling  
an effective resistance of 75Ω (RTT2(EFF) = R2/2). Similarly, if “sw2”  
is enabled, all R2 values that are 300Ω each, enable an effective  
ODT resistance of 150Ω (RTT2(EFF) = R2/2). Switch “sw3” enables  
R1 values of 100Ω enabling effective resistance of 50Ω.  
DLL ENABLE/DISABLE  
The DLL may be enabled or disabled by programming bit E0  
during the LM command, as shown in Figure 7. The DLL must  
be enabled for normal operation. DLL enable is required during  
power-up initialization and upon returning to normal operation after  
having disabled the DLLfor the purpose of debugging or evaluation.  
Enabling the DLL should always be followed by resetting the DLL  
using an LM command.  
The ODT control ball is used to determine when RTT(EFF) is turned  
on and off, assuming ODT has been enabled via bits E2 and E6 of  
the EMR. The ODT feature and ODT input ball are only used during  
active, active power-down (both fast-exit and slow-exit modes),  
and precharge power-down modes of operation. ODT must be  
turned off prior to entering self refresh mode. During power-up and  
initialization of the DDR2 SDRAM, ODT should be disabled until  
issuing the EMR command to enable the ODT feature, at which  
point the ODT ball will determine the RTT(EFF) value. Anytime the  
EMR enables the ODT function, ODT may not be driven HIGH until  
eight clocks after the EMR has been enabled. See “ODT Timing”  
section for ODT timing diagrams.  
The DLL is automatically disabled when entering SELF REFRESH  
operation and is automatically re-enabled and reset upon exit of  
SELF REFRESH operation.  
Any time the DLL is enabled (and subsequently reset), 200 clock  
cycles must occur before a READ command can be issued, to  
allow time for the internal clock to synchronize with the external  
clock. Failing to wait for synchronization to occur may result in a  
violation of the tAC or tDQSCK parameters.  
OUTPUT DRIVE STRENGTH  
OFF-CHIP DRIVER (OCD) IMPEDANCE  
CALIBRATION  
The OFF-CHIP DRIVER function is an optional DDR2 JEDEC  
feature not supported and thereby must be set to the default state.  
Enabling OCD beyond the default settings will alter the I/O drive  
characteristics and the timing and output I/O specications will no  
longer be valid.  
The output drive strength is dened by bit E1, as shown in Figure  
7. The normal drive strength for all outputs is specied to be  
SSTL_18. Programming bit E1 = 0 selects normal (full strength)  
drive strength for all outputs. Selecting a reduced drive strength  
option (E1 = 1) will reduce all outputs to approximately 45 to 60  
percent of the SSTL_18 drive strength. This option is intended  
for the support of lighter load and/or point-to-point environments.  
DQS# ENABLE/DISABLE  
The DQS# ball is enabled by bit E10. When E10 = 0, DQS# is the  
complement of the differential data strobe pair DQS/DQS#. When  
disabled (E10 = 1), DQS is used in a single ended mode and the  
DQS# ball is disabled. When disabled, DQS# should be left oating;  
however, it may be tied to ground via a resistor. This function is  
also used to enable/disable RDQS#. If RDQS is enabled (E11 =  
1) and DQS# is enabled (E10 = 0), then both DQS# and RDQS#  
will be enabled. RDQS is not available on this device.  
OUTPUT ENABLE/DISABLE  
The OUTPUT ENABLE function is dened by bit E12, as shown in  
Figure 7. When enabled (E12 = 0), all outputs (DQs, DQS, DQS#)  
function normally. When disabled (E12 = 1), all DDR2 SDRAM  
outputs (DQs, DQS, DQS#) are disabled, thus removing output  
buffer current. The output disable feature is intended to be used  
during ICC characterization of read current.  
ON-DIE TERMINATION (ODT)  
ODT effective resistance, RTT (EFF), is dened by bits E2 and E6  
of the EMR, as shown in Figure 7. The ODT feature is designed  
to improve signal integrity of the memory channel by allowing the  
DDR2 SDRAM controller to independently turn on/off ODT for any  
or all devices. RTT effective resistance values of 50Ω ,75Ω, and  
150Ω are selectable and apply to each DQ, UDQS/UDQS#, LDQS/  
LDQS#, and UDM/LDM signals. Bits (E6, E2) determine what ODT  
resistance is enabled by turning on/off “sw1,” “sw2,” or “sw3.” The  
ODT effective resistance value is selected by enabling switch  
11  
4163.12E-0716-ss-W3H128M72E-XSBX / XNBX  
Mercury Corp. - Memory and Storage Solutions • (602) 437-1520 • www.mrcy.com  
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