ML145170
LANSDALE Semiconductor, Inc.
Figure 7. Test Circuit fin
Ω
*Characteristic Impedance
Figure 8.
Figure 8a. Test Circuit, OSC Circuit Externally Driven [Note] Figure 8b. Circuit to Eliminate Self–Oscillation,
OSC Circuit Externally Driven [Note]
Ω
µ
µ
Ω
Ω
Ω
Ω
Figure 10. Switching Waveform
Figure 9. Test Circuit, OSC Circuit with Crystal
Figure 12. Test Load Circuit
Figure 11. Switching Waveform
*Includes all probe and
fixture capacitance.
NOTE: Use the circuit of Figure 8b to eliminate self–oscillation of the OSC pin when the ML145170 has power applied with no external signal.
in
applied at V . (Self–oscillation is not harmful to the ML145170 and does not damage the IC.)
in
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