ML145170
LANSDALE Semiconductor, Inc.
LOOP SPECIFICATION ( T = –40° to 85°C)
A
Guaranteed Range
V
DD
Figure
No.
V
Min
Max
Parameter
Test Condition
Symbol
Unit
Input Frequency, f [Note]
V
≥ 500 mVpp Sine Wave
f
7
2.7
3.0
4.5
5.5
5.0
5.0
25
80
MHz
in
in
N Counter Set to Divide Ratio
Such that fv≤ 2.0 MHz
100
185
185
45
Input Frequency, OSC
Externally Driven with AC–coupled
Signal
V
≥ 1.0 V Sine Wave
out
f
8a
2.7
3.0
4.5
5.5
1.0*
1.0*
1.0*
1.0*
22
25
30
35
MHz
MHz
in
in
PP
OSC = No Connect
R Counter Set to Divide Ratio
Such that f ≤ 2 MHz
R
Crystal Frequency, OSC and OSC
C1 ≤ 30 pF
C2 ≤ 30pF
Includes Stray Capacitance
f
9
2.7
3.0
4.5
5.5
2.0
2.0
2.0
2.0
12
12
15
15
in
out
XTAL
Output Frequency REF
C = 30 pF
f
10, 12
2.7
4.5
5.5
DC
DC
DC
–
10
10
MHz
MHz
ns
out
L
out
Operating Frequency of the
Phase Detectors
f
2.7
4.5
5.5
DC
DC
DC
–
20
20
Output Pulse Width, φ , φ , and LD
f
R
in Phase with f
t
11, 12
11, 12
2.7
4.5
5.5
–
20
16
–
100
90
R
V
V
w
C = 50 pF
L
Output Transition Times,
φ , φ , LD, f , and f
C = 50pF
L
t
,
2.7
4.5
5.5
–
–
–
–
65
60
ns
TLH
t
R
V
R
V
THL
Input Capacitance
f
C
–
–
–
–
–
–
7.0
7.0
pF
in
in
in
OSC
* IF lower frequency is desired, use wave shaping or higher amplitude sinusoidal signal in AC–coupled case. Also, see Figure 22 for DC coupling
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