03 | Keysight | B1505A Power Device Analyzer/Curve Tracer - Data Sheet
– Oscilloscope view allows verifica-
tion of applied voltage and current
waveforms
– MS Windows-based EasyEXPERT
group+ software facilitates data man-
agement and simplifies data analysis
8. SMU filter: ON (for HPSMU and
MPSMU)
Basic features
Precision measurement across a wide
range of operating conditions
– All-in-one solution for power device
characterization up to 1500 A/10 kV
– Medium current measurement with
high voltage bias (e.g. 500 mA at
1200 V).
– μΩ resistance measurement capability
– Accurate sub-picoamp level current
measurement at high voltage bias
– Fully automated thermal test from
-50 to +250 °C
Extensive device evaluation capabilities
– Fully automated Capacitance (Ciss,
Coss, Crss, etc.) measurement at up
to 3000 V of DC bias
– High power pulsed measurements
down to 10 μs
– Gate charge measurement cover-
ing Nch MOSFETs and IGBTs both in
package and on wafer
– High voltage/high current fast switch
option to characterize GaN current
collapse effect
– Up to 5 high voltage (3 kV) source/
measure unit channels for reliability
applications
– Perform both hot and cold tempera-
ture dependency testing in an inter-
lock equipped test fixture
9. SMU measurement terminal
connection: Kelvin connection
(for HPSMU, MPSMU, HCSMU and
MCSMU), non-Kelvin (for HVSMU)
Upgradable and scalable hardware
architecture
– A wide selection of measurement
modules
– Support for high power devices with
up to 6 pins
Note: This document lists specifica-
tions and supplemental characteris-
tics for the B1505A and its associated
modules. The specifications are the
standards against which the B1505A
and its associated modules are
tested. When the B1505A or any of its
associated modules are shipped from
the factory, they meet the specifica-
tions. The “supplemental” charac-
teristics described in the following
specifications are not guaranteed,
but provide useful information about
the functions and performance of the
instrument.
GPIB, USB, LAN interfaces and VGA video
output port
Self-test, self-calibration, diagnostics
Specification conditions
The measurement and output accuracy
are specified under the conditions listed
below. Note: The SMU measurement and
output accuracies are specified at the
SMU connector terminals, using the Zero
Check terminal as a reference.
Note: Module upgrades to existing
B1505A systems must be carried out
at a Keysight Technologies, Inc. ser-
vice centre. In order to ensure system
specifications the new modules need
to be installed and the complete unit
calibrated. Contact your nearest Key-
sight Technologies office to arrange
the installation and calibration of new
B1505A modules.
1. Temperature: 23 ± 5 °C
2. Humidity: 20 to 70%
3. Self-calibration after a 40 minute
warm-up is required.
4. Ambient temperature change less than
±1 °C after self-calibration execution.
(Note: This does not apply to the
MFCMU).
Improved measurement efficiency
– Switch between high-voltage and
high-current measurements without
the need to recable
– Automated reconfiguration of test
circuitry for transistor capacitance
measurement (Ciss, Coss, Crss, Cgs,
Cgd, Cds, etc.) for both packaged and
on-wafer devices
– Standard test fixtures with interlock
for safe packaged power device test-
ing
– Supported and secure on-wafer high-
power testing over 200 A and up to
10 kV
5. Measurement made within one hour
after self-calibration execution.(Note:
This does not apply to the MFCMU).
6. Calibration period: 1 year
7. SMU integration time setting:
1 PLC (1 nA to 1 A range, voltage
range), 200 µs (20 A range)
Averaging of high-speed ADC:
128 samples per 1 PLC
KEYSIGHT [ Keysight Technologies ]
