28F004/400B3, 28F008/800B3, 28F016/160B3, 28F320B3, 28F640B3
AC Characteristics, Continued
Density
Product
64 Mbit
90 ns
2.7 V–3.6 V
100 ns
#
Sym
Parameter
Unit
V
2.7 V–3.6 V
CC
Note
Min
Max
Min
Max
R1
R2
R3
R4
R5
R6
R7
R8
R9
t
Read Cycle Time
90
100
ns
ns
ns
ns
ns
ns
ns
ns
ns
AVAV
t
t
Address to Output Delay
CE# to Output Delay
90
90
100
100
20
AVQV
ELQV
GLQV
PHQV
1
1
t
OE# to Output Delay
20
t
RP# to Output Delay
150
150
t
CE# to Output in Low Z
OE# to Output in Low Z
CE# to Output in High Z
OE# to Output in High Z
Output Hold from Address, CE#, or
2
2
2
2
0
0
0
0
ELQX
GLQX
EHQZ
GHQZ
t
t
20
20
20
20
t
R10
t
2
0
0
ns
OH
OE# Change, Whichever Occurs First
NOTES:
1. OE# may be delayed up to t
t
after the falling edge of CE# without impact on t
.
ELQV– GLQV
ELQV
2. Sampled, but not 100% tested.
See Figure 7 for the AC waveform for read operations.
See Figure 5, “Input/Output Reference Waveform” on page 22 for timing measurements and maximum
allowable input slew rate.
Figure 7. AC Waveform: Read Operations
Device
Address Selection
Standby
Data Valid
VIH
Address Stable
ADDRESSES (A)
CE# (E)
VIL
VIH
R1
VIL
R8
R9
VIH
VIL
OE# (G)
VIH
VIL
WE# (W)
R4
R3
R7
R10
VOH
VOL
R6
High Z
High Z
DATA (D/Q)
Valid Output
R2
VIH
VIL
RP# (P)
R5
26
3UHOLPLQDU\
INTEL [ INTEL ]
