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EPM1270GF100I4N 参数 Datasheet PDF下载

EPM1270GF100I4N图片预览
型号: EPM1270GF100I4N
PDF下载: 下载PDF文件 查看货源
内容描述: [Flash PLD, PBGA100, 11 X 11 MM, 1 MM PITCH, LEAD FREE, FBGA-100]
分类和应用: 输入元件可编程逻辑
文件页数/大小: 98 页 / 1060 K
品牌: INTEL [ INTEL ]
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Hot Socketing & Power-On Reset in MAX II Devices  
Hot Socketing Feature Implementation in MAX II Devices  
The hot socketing feature turns off (tri-states) the output buffer during the  
power-up event (either VCCINT or VCCIO supplies) or power down. The  
hot-socket circuit generates an internal HOTSCKTsignal when either  
VCCINT or VCCIO is below the threshold voltage. The HOTSCKTsignal cuts  
off the output buffer to make sure that no DC current (except for weak  
pull-up leaking) leaks through the pin. When VCC ramps up very slowly,  
VCC may still be relatively low even after the power-on reset (POR) signal  
is released and device configuration is complete.  
Each I/O and clock pin has the following circuitry, as shown in  
Figure 4–1.  
Figure 4–1. Hot Socketing Circuit Block Diagram for MAX II Devices  
Power On  
Reset  
Monitor  
VCCIO  
Weak  
Pull-Up  
Resistor  
Output Enable  
PAD  
Voltage  
Tolerance  
Control  
Hot Socket  
Input Buffer  
to Logic Array  
The POR circuit monitors VCCINT and VCCIO voltage levels and keeps I/O  
pins tri-stated until the device has completed its flash memory  
configuration of the SRAM logic. The weak pull-up resistor (R) from the  
I/O pin to VCCIO is enabled during download to keep the I/O pins from  
floating. The 3.3-V tolerance control circuit permits the I/O pins to be  
driven by 3.3 V before VCCIO and/or VCCINT are powered, and it prevents  
the I/O pins from driving out when the device is not fully powered or  
Altera Corporation  
February 2006  
Core Version a.b.c variable  
4–3  
MAX II Device Handbook, Volume 1  
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