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DT28F320J5-120 参数 Datasheet PDF下载

DT28F320J5-120图片预览
型号: DT28F320J5-120
PDF下载: 下载PDF文件 查看货源
内容描述: 5伏英特尔的StrataFlash ?内存 [5 Volt Intel StrataFlash® Memory]
分类和应用: 闪存存储内存集成电路光电二极管
文件页数/大小: 51 页 / 620 K
品牌: INTEL [ INTEL ]
 浏览型号DT28F320J5-120的Datasheet PDF文件第39页浏览型号DT28F320J5-120的Datasheet PDF文件第40页浏览型号DT28F320J5-120的Datasheet PDF文件第41页浏览型号DT28F320J5-120的Datasheet PDF文件第42页浏览型号DT28F320J5-120的Datasheet PDF文件第44页浏览型号DT28F320J5-120的Datasheet PDF文件第45页浏览型号DT28F320J5-120的Datasheet PDF文件第46页浏览型号DT28F320J5-120的Datasheet PDF文件第47页  
28F320J5 and 28F640J5  
Figure 12. Transient Input/Output Reference Waveform for VCCQ = 5.0 V 10% (Standard  
Testing Configuration)  
2.4  
2.0  
0.8  
2.0  
Output  
0.8  
Input  
Test Points  
0.45  
NOTE: AC test inputs are driven at V  
(2.4 V  
) for a Logic “1” and V (0.45 V  
TTL OL TTL  
) for a Logic "0." Input timing begins at  
OH  
V
(2.0 V  
) and V (0.8 V  
). Output timingends at V and V . Input rise and fall times (10% to 90%) <10 ns.  
IH  
TTL IL TTL  
IH IL  
Figure 13. Transient Input/Output Reference Waveform  
2.7  
Input  
1.35  
Test Points  
1.35 Output  
0.0  
NOTE: AC test inputs are driven at 2.7 V for a Logic “1” and 0.0 V for a Logic “0.” Input timing begins, and output timing ends,  
at 1.35 V (50% of V ). Input rise and fall times (10% to 90%) <10 ns.  
CCQ  
Figure 14. Transient Equivelent Testing Load Circuit  
1.3V  
1N914  
RL = 3.3 k  
Device  
Under Test  
Out  
CL  
NOTE:  
C Includes JigCapacitance  
L
Table 20. Test Configuration Capacitance Loading Value  
Test Configuration  
C (pF)  
L
V
V
= 5.0 V ± 10%  
= 2.7 V3.6 V  
100  
50  
CCQ  
CCQ  
Datasheet  
43  
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