欢迎访问ic37.com |
会员登录 免费注册
发布采购

80960JD-40 参数 Datasheet PDF下载

80960JD-40图片预览
型号: 80960JD-40
PDF下载: 下载PDF文件 查看货源
内容描述: 嵌入式32位微处理器 [EMBEDDED 32-BIT MICROPROCESSOR]
分类和应用: 微处理器
文件页数/大小: 61 页 / 1555 K
品牌: INTEL [ INTEL ]
 浏览型号80960JD-40的Datasheet PDF文件第11页浏览型号80960JD-40的Datasheet PDF文件第12页浏览型号80960JD-40的Datasheet PDF文件第13页浏览型号80960JD-40的Datasheet PDF文件第14页浏览型号80960JD-40的Datasheet PDF文件第16页浏览型号80960JD-40的Datasheet PDF文件第17页浏览型号80960JD-40的Datasheet PDF文件第18页浏览型号80960JD-40的Datasheet PDF文件第19页  
A
80960JD  
Table 4. Pin Description — Processor Control Signals, Test Signals and Power (Sheet 2 of 2)  
NAME  
FAIL  
TYPE  
DESCRIPTION  
O
FAIL indicates a failure of the processor’s built-in self-test performed during initial-  
ization. FAIL is asserted immediately upon reset and toggles during self-test to  
indicate the status of individual tests:  
R(0)  
H(Q)  
P(1)  
• When self-test passes, the processor deasserts FAIL and begins operation from  
user code.  
• When self-test fails, the processor asserts FAIL and then stops executing.  
0 = self test failed  
1 = self test passed  
TCK  
I
TEST CLOCK is a CPU input which provides the clocking function for IEEE 1149.1  
Boundary Scan Testing (JTAG). State information and data are clocked into the  
processor on the rising edge; data is clocked out of the processor on the falling edge.  
TDI  
I
TEST DATA INPUT is the serial input pin for JTAG. TDI is sampled on the rising edge  
S(L)  
of TCK, during the SHIFT-IR and SHIFT-DR states of the Test Access Port.  
TDO  
O
TEST DATA OUTPUT is the serial output pin for JTAG. TDO is driven on the falling  
edge of TCK during the SHIFT-IR and SHIFT-DR states of the Test Access Port. At  
other times, TDO floats. TDO does not float during ONCE mode.  
R(Q)  
HQ)  
P(Q)  
TRST  
TMS  
I
TEST RESET asynchronously resets the Test Access Port (TAP) controller function  
of IEEE 1149.1 Boundary Scan testing (JTAG). When using the Boundary Scan  
feature, connect a pulldown resistor between this pin and VSS. If TAP is not used, this  
pin must be connected to VSS; however, no resistor is required. See Section 4.3,  
Connection Recommendations (pg. 24).  
A(L)  
I
TEST MODE SELECT is sampled at the rising edge of TCK to select the operation  
S(L)  
of the test logic for IEEE 1149.1 Boundary Scan testing.  
VCC  
POWER pins intended for external connection to a VCC board plane.  
VCCPLL  
PLL POWER is a separate VCC supply pin for the phase lock loop clock generator. It  
is intended for external connection to the VCC board plane. In noisy environments,  
add a simple bypass filter circuit to reduce noise-induced clock jitter and its effects on  
timing relationships.  
VSS  
NC  
GROUND pins intended for external connection to a VSS board plane.  
NO CONNECT pins. Do not make any system connections to these pins.  
11  
PRELIMINARY