TC1796
Package and Reliability
5.4
Quality Declarations
Table 37
Parameter
Quality Parameters
Symbol
Values
Unit Note / Test Condition
Min. Typ. Max.
Operation
Lifetime1)2)
tOP
–
–
–
–
–
–
–
–
24000 hours at average weighted junction
temperature Tj = 127oC
66000 hours at average weighted junction
temperature Tj = 100oC
20
years at average weighted junction
temperature Tj = 85oC
ESD susceptibility VHBM
according to
Human Body
Model (HBM)
2000
V
Conforming to
EIA/JESD22-A114-B
ESD susceptibility VHBM1
–
–
–
–
500
500
V
V
–
of the LVDS pins
ESD susceptibility VCDM
Conforming to
JESD22-C101-C
according to
Charged Device
Model (CDM)
Moisture
MSL
–
–
3
–
Conforming to Jedec
J-STD-020C for 240°C
Sensitivity Level
1) This lifetime refers only to the time when the device is powered on.
2) One example of a detailed temperature profile is:
2000 hours at Tj = 150oC
16000 hours at Tj = 125oC
6000 hours at Tj = 110oC
This example is equivalent to the operation lifetime and average temperatures given in the table.
Data Sheet
133
V1.0, 2008-04
INFINEON [ Infineon ]
