Electrical Characteristics
Table 29
DCL Clock Characteristics (IOM®-2)
Parameter
Symbol
Limit Values
Unit
Test Condition
min.
520
240
240
240
100
100
typ.
651
391
260
244
max.
(TE) 1536 kHz
t
t
t
t
t
t
PO
782
541
281
ns
ns
ns
ns
ns
ns
osc ± 100 ppm
osc ± 100 ppm
osc ± 100 ppm
WHO
WLO
PI
(LT-S, LT-T) 4096 kHz
WHI
WLI
Note: For NT characteristics, see IOM-1 case.
Table 30
CP Clock Characteristics (IOM®-1 TE mode)
Parameter
Symbol
Limit Values
Unit
Test Condition
min.
520
240
240
typ.
651
391
260
max.
782
541
281
(TE) 1536 kHz
t
t
t
PO
ns
ns
ns
osc ± 100 ppm
osc ± 100 ppm
osc ± 100 ppm
WHO
WLO
Table 31
CP Clock Characteristics (LT-T mode)
Parameter
Symbol
Limit Values
Unit
Test Condition
min.
1822
470
typ.
max.
(LT-T) 512 kHz
t
t
t
PO
1953
651
2084
832
ns
ns
ns
osc ± 100 ppm
osc ± 100 ppm
osc ± 100 ppm
WHO
WLO
1121
1302
1483
Table 32
X1 Clock Characteristics (TE mode)
Parameter
Symbol
Limit Values
typ.
Unit
Test Condition
min.
max.
(TE) 3840 kHz
t
t
t
PO
– 100 ppm 260
100 ppm ns
osc ± 100 ppm
osc ± 100 ppm
osc ± 100 ppm
WHO
WLO
120
120
130
130
140
140
ns
ns
Semiconductor Group
263