IDT7027S/L
High-Speed 32K x 16 Dual-Port Static RAM
Military, Industrial and Commercial Temperature Ranges
5V 5V
AC Test Conditions
dInput Pulse Levels
GND to 3.0V
5ns Max.
1.5V
893Ω
893
Ω
Input Rise/Fall Times
DATAOUT
BUSY
INT
DATAOUT
Input Timing Reference Levels
Output Reference Levels
Output Load
30pF
5pF*
1.5V
347
Ω
347Ω
Figures 1 and 2
3199 drw 04
3199 tbl 11
Figure 2. Output Test Load
(for tLZ, tHZ, tWZ, tOW)
Figure 1. AC Output Test Load
*Including scope and jig.
AC Electrical Characteristics Over the
OperatingTemperatureandSupplyVoltageRanges(4,6)
7027X20
Com'l Only
7027X25
Com'l, Ind.
& Military
7027X35
Com'l &
Military
7027X55
Com'l &
Military
Symbol
Parameter
Min.
Max.
Min.
Max.
Min.
Max.
Min.
Max. Unit
READ CYCLE
____
____
____
____
tRC
Read Cycle Time
20
25
35
55
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
____
____
____
____
tAA
Address Access Time
20
20
20
25
25
25
35
35
35
55
55
55
Chip Enable Access Time(3)
____
____
____
____
____
____
____
____
____
____
____
____
tACE
tABE
Byte Enable Access Time(3)
AOE
t
Output Enable Access Time
12
13
20
30
____
____
____
____
tOH
tLZ
Output Hold from Address Change
Output Low-Z Time(1,2)
3
3
3
3
____
____
____
____
3
3
3
3
Output High-Z Time(1,2)
12
15
15
25
____
____
____
____
HZ
t
tPU
tPD
Chip Enable to Power Up Time(2,5)
Chip Disable to Power Down Time(2,5)
Semaphore Flag Update Pulse (OE or SEM)
Semaphore Address Access Time
0
0
0
0
____
____
____
____
____
____
____
____
20
25
35
50
____
____
____
____
SOP
t
10
12
15
15
____
____
____
____
tSAA
20
25
35
55
ns
3199 tbl 12
NOTES:.
1. Transition is measured 0mV from Low or High-impedance voltage with Output Test Load (Figure 2).
2. This parameter is guaranteed by device characterization, but is not production tested.
3. To access RAM, CE = VIL and SEM = VIH. To access semaphore, CE= VIH and SEM = VIL.
4. 'X' in part numbers indicates power rating (S or L).
5. Refer to Chip Enable Truth Table.
6. Industrial temperature: for other speeds, packages and powers contact your sales office.
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