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TW8 参数 Datasheet PDF下载

TW8图片预览
型号: TW8
PDF下载: 下载PDF文件 查看货源
内容描述: 16位SIN / COS插补算法的自动校准 [16-BIT SIN/COS INTERPOLATOR WITH AUTO-CALIBRATION]
分类和应用:
文件页数/大小: 63 页 / 1930 K
品牌: ICHAUS [ IC-HAUS GMBH ]
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iC-TW8 16-BIT SIN/COS INTERPOLATOR  
Serial Configuration Mode  
Jan 9, 2013 Page SC22/36  
The Correction Configuration controls how the auto  
adaption corrections are applied to the AB signal  
path parameters during operation. First, select linear  
or exponential correction mode. Linear correction  
mode is the recommended selection and provides  
the smoothest correction; parameter corrections are  
applied one increment per correction cycle. This  
results in the least disturbance to the interpolator  
output when the auto adaption corrections are made.  
FAULT Pin Configuration  
In the FAULT Pin Configuration tab, select whether  
the FAULT output (pin 20) is active high or active  
low. Active low is the recommended since this is the  
startup default of the iC-TW8. If active high is cho-  
sen, the FAULT output will be active (high) at  
startup until configured to active low polarity during  
the startup process.  
The FAULT output can be configured to stay active  
for a time after a fault condition has cleared to en-  
hance observation of transient fault conditions. The  
amount of time by which the output is prolonged is  
fixed and inversely proportional to crystal frequen-  
cy. Next, choose whether or not the AB outputs  
should be stopped when the FAULT output is ac-  
tive.  
Faster correction is available in exponential correc-  
tion mode which allows selection of the desired cor-  
rection step size. Small correction steps correct 25%  
of the parameter error every correction cycle; medi-  
um correction steps correct 50% of the parameter  
error every correction cycle; large correction steps  
correct 75% of the parameter error every correction  
cycle. Experimentation may be required to deter-  
mine the optimal correction configuration.  
iC-TW8 fault conditions can be configured to either  
activate or latch the FAULT output. Faults which do  
not latch the FAULT output only activate the  
FAULT output for the time during which the condi-  
tion is active (subject to prolonging, as explained  
above). Faults which latch the FAULT output are  
cleared at restart or may be cleared by writing to the  
STAT_SP, STAT_EE, or FLT_STAT registers us-  
ing one of the serial ports (see Programmer’s Refer-  
ence).  
The correction timebase determines the rate at  
which auto adaption corrections are applied. In gen-  
eral, enter 0 for the desired correction timebase and  
the design tool confirms the closest possible actual  
timebase using the current crystal. This results in  
auto adaption corrections being applied as quickly  
as possible. Larger timebase values provide slower  
response.  
Lastly, select whether or not the auto adapted pa-  
rameter values are written to the EEPROM during  
operation (auto store) and used at the next restart. If  
auto store is enabled, enter the desired digital offset  
and gain match thresholds; the design tool confirms  
the closest available (actual) values. These thresh-  
olds are the levels of change in the respective pa-  
rameters that must be achieved by auto adaption to  
cause new values to be written to EEPROM. Since  
most EEPROMS are only guaranteed for a finite  
number of write cycles, these thresholds must be set  
high enough to minimize unnecessary EEPROM  
writes. If auto store is disabled, these thresholds are  
ignored.  
A crystal fault is active if the iC-TW8 is configured  
to use an external crystal or clock source (see page  
16) and the expected external signal is not present.  
In this case, the iC-TW8 reverts to using its internal  
oscillator. Once an external clock signal becomes  
available, the iC-TW8 switches back to using the  
external oscillator and clears the crystal fault. Clear-  
ing the crystal fault also de-activates the FAULT  
output if the crystal fault is not configured to latch.  
An EEPROM fault is active if the EEPROM has not  
been initialized, there is a hardware or communica-  
tion problem with the EEPROM, or if any of the  
internal checksums are invalid. It is recommended  
to latch EEPROM faults as they can result in un-  
defined startup conditions.  
A fatal operational fault is active if the instantane-  
ous sensor input velocity is greater than the fatal  
fault speed shown on the AB configuration tab (see  
page 18), the filter lag is too large (see page 19), or  
the AB output is more than half an input cycle be-  
hind the sensor input position due to prolonged op-  
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