HY29F002T
TEST CONDITIONS
+ 5V
Table 7. Test Specifications
Test
Condition
- 45 - 70
- 55 - 90
Unit
2.7
KOhm
Output Load
1 TTL Gate
Output Load Capacitance (CL)
Input Rise and Fall Times
Input Signal Low Level
Input Signal High Level
30
5
100
20
pF
ns
V
DEVICE
UNDER
TEST
All diodes
are
1N3064
or
equivalent
0.0
3.0
0.45
2.4
V
6.2
KOhm
CL
Low Timing Measurement
Signal Level
1.5
1.5
0.8
2.0
V
V
High Timing Measurement
Signal Level
Figure 11. Test Setup
3.0 V
0.0 V
I
nput
1.5 V
Measurement Level
1.5 V
Output
HY29F002T-45, -55 Versions
2.4 V
2.0 V
2.0 V
0.8 V
Measurement
Input
Output
Levels
0.8 V
0.45 V
HY29F002T-70, -90 Versions
Figure 12. Input Waveforms and Measurement Levels
Rev. 4.1/May 01
22
HYNIX [ HYNIX SEMICONDUCTOR ]
