GMM27333230ANTG
- 8, - 7K, -7J, -10K
Max
Parameter
Symbol
Unit Test conditions Notes
Min
Input leakage current
Output leakage current
Output high voltage
Output low voltage
ILI
-1
1
1.5
-
uA 0<=Vin<=VCC
0<=Vout <=VCC
uA
ILO
-1.5
2.4
-
DQ = disable
VOH
VOL
V
V
IOH = -2 mA
IOL =2 mA
0.4
Notes : 1. ICC depends on output load condition when the device is selected. ICC (max) is specified at the
output open condition.
2. One bank operation.
3. Addresses are changed once per one cycle.
4. Addresses are changed once per two cycles.
5. After Power down mode, CLK operating current.
6. After Power down mode, no CLK operating current.
7. After self refresh mode set, self refresh current.
8. Input signals are VIH or VIL fixed.
CC
CCQ
Capacitance (Ta = 25C, V , V
= 3.3V +/- 0.3V)
Symbol
Parameter
Min
Max
TBD
TBD
TBD
TBD
TBD
TBD
Unit
pF
Notes
1, 3
I1
C
Input capacitance (A0 ~ A11, BA0,1)
Input capacitance (RAS, CAS, WE, CKE)
Input capacitance (CK0~CK3)
-
-
-
-
-
-
I2
C
pF
1, 3
I3
C
pF
1, 3
I4
C
Input capacitance (S0~S3)
pF
1, 3
I5
C
Input capacitance (DQMB0 ~ DQMB7)
I/O capacitance (DQ0 ~ 63)
pF
1, 3
I/O
C
pF
1, 2 ,3
Note :
1. Capacitance measured with Boonton Meter or effective capacitance measuring method.
2. DQMB = VIH to disable Dout.
3. This parameter is sampled and not 100% tested.
Rev. 1.1/Dec.99
7
HYNIX [ HYNIX SEMICONDUCTOR ]
