ELECTRICAL CHARACTERISTICS
TIMING DIAGRAMS
TIMING DIAGRAMS
33912
TRANSIENT PULSE
GENERATOR
1.0nF
LIN
(
NOTE
)
GND
PGND LGND AGND
Note Waveform per ISO 7637-2. Test Pulses 1, 2, 3a, 3b.
Figure 4. Test Circuit for Transient Test Pulses (LIN)
33912
Transient Pulse
Generator
(Note)
1.0 nF
L1, L2, L3, L4
10 k
Ω
GND
PGND LGND AGND
Note Waveform per ISO 7637-2. Test Pulses 1, 2, 3a, 3b,.
Figure 5. Test Circuit for Transient Test Pulses (Lx)
VSUP
R0
LIN
TXD
RXD
R0 AND C0 COMBINATIONS:
• 1.0KΩ and 1.0nF
• 660Ω and 6.8nF
• 500Ω and 10nF
C0
Figure 6. Test Circuit for LIN Timing Measurements
33912
Analog Integrated Circuit Device Data
Freescale Semiconductor
17