EDD1204ALTA, EDD1208ALTA, EDD1216ALTA
13.5 DC Characteristics 2 (Recommended Operating Conditions unless otherwise noted)
Parameter
Symbol
II(L)
Test condition
MIN.
MAX.
2
Unit Notes
Input leakage current
Any input 0 V ≤ VIN ≤ VDD, all other pins not under
−2
µA
test = 0 V
Output leakage current
Output high current
Output low current
IO(L)
IOH
IOL
DOUT is disabled, VO = 0 to VDDQ + 0.3 V
VOUT = 1.95 V
−5
5
µA
mA
mA
–15.2
15.2
VOUT = 0.35 V
13.6 AC Characteristics (Recommended Operating Conditions unless otherwise noted)
13.6.1 Test Conditions
Parameter
Input Reference voltage (Input timing measurement reference level)
Termination voltage (Output timing measurement reference level)
High level ac input voltage
Symbol
VREF
MIN.
MAX.
Unit Notes
V
0.49 x VDDQ
VREF − 0.04
VREF + 0.31
0.51 x VDDQ
VREF + 0.04
VTT
V
V
1
VIH(ac)
VIL(ac)
VID(ac)
SLEW
Low level ac input voltage
VREF − 0.31
V
Input differential voltage (CLK and /CLK)
Input signal slew rate
0.7
1
VDDQ + 0.6
V
V/ns
2
Notes 1. Output waveform timing is measured where the output signal crosses through the VTT level.
2. Slew rate is to be maintained in the VIL (ac) to VIH(ac) range of the input signal swing.
SLEW = (VIH(ac)-VIL(ac))/ ∆t
V
TT
RT = 50Ω
Output
CLOAD = 30 pF
39
Preliminary Data Sheet E0136E30
ELPIDA [ ELPIDA MEMORY ]
