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EBD21RD4ABNA-7A 参数 Datasheet PDF下载

EBD21RD4ABNA-7A图片预览
型号: EBD21RD4ABNA-7A
PDF下载: 下载PDF文件 查看货源
内容描述: 注册2GB DDR SDRAM DIMM [2GB Registered DDR SDRAM DIMM]
分类和应用: 存储内存集成电路动态存储器双倍数据速率时钟
文件页数/大小: 19 页 / 176 K
品牌: ELPIDA [ ELPIDA MEMORY ]
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EBD21RD4ABNA  
-7A  
-7B  
-10  
Parameter  
Symbol  
tIS  
min.  
max  
min.  
max  
min.  
max  
Unit  
ns  
Notes  
8
Address and control input setup  
time  
0.9  
0.9  
2.2  
2
0.9  
0.9  
2.2  
2
1.1  
1.1  
2.5  
2
Address and control input hold  
time  
tIH  
ns  
8
7
Address and control input pulse  
width  
tIPW  
tMRD  
tRAS  
tRC  
ns  
Mode register set command cycle  
time  
tCK  
Active to Precharge command  
period  
45  
120000 45  
120000 50  
120000 ns  
Active to Active/Auto refresh  
command period  
67.5  
67.5  
70  
ns  
Auto refresh to Active/Auto refresh  
command period  
tRFC  
tRCD  
tRP  
75  
20  
20  
75  
20  
20  
80  
20  
20  
ns  
ns  
ns  
Active to Read/Write delay  
Precharge to active command  
period  
Active to auto precharge delay  
tRAP  
tRCD min. —  
tRCD min. —  
tRCD min. —  
ns  
ns  
ns  
Active to active command period tRRD  
15  
15  
15  
15  
15  
15  
Write recovery time  
tWR  
Auto precharge write recovery  
and precharge time  
(tWR/tCK)  
+(tRP/tCK)  
(tWR/tCK)  
+(tRP/tCK)  
(tWR/tCK)  
+(tRP/tCK)  
tDAL  
tCK  
13  
Internal write to Read command  
delay  
tWTR  
tREF  
1
1
1
tCK  
µs  
Average periodic refresh interval  
7.8  
7.8  
7.8  
Notes: 1. On all AC measurements, we assume the test conditions shown in the next page. For timing parameter  
definitions, see ‘Timing Waveforms’ section.  
2. This parameter defines the signal transition delay from the cross point of CK and /CK. The signal  
transition is defined to occur when the signal level crossing VTT.  
3. The timing reference level is VTT.  
4. Output valid window is defined to be the period between two successive transition of data out or DQS  
(read) signals. The signal transition is defined to occur when the signal level crossing VTT.  
5. tHZ is defined as DOUT transition delay from Low-Z to High-Z at the end of read burst operation. The  
timing reference is cross point of CK and /CK. This parameter is not referred to a specific DOUT voltage  
level, but specify when the device output stops driving.  
6. tLZ is defined as DOUT transition delay from High-Z to Low-Z at the beginning of read operation. This  
parameter is not referred to a specific DOUT voltage level, but specify when the device output begins  
driving.  
7. Input valid windows is defined to be the period between two successive transition of data input or DQS  
(write) signals. The signal transition is defined to occur when the signal level crossing VREF.  
8. The timing reference level is VREF.  
9. The transition from Low-Z to High-Z is defined to occur when the device output stops driving. A specific  
reference voltage to judge this transition is not given.  
10. tCK (max.) is determined by the lock range of the DLL. Beyond this lock range, the DLL operation is not  
assured.  
11. tCK = tCK (min.) when these parameters are measured. Otherwise, absolute minimum values of these  
values are 10% of tCK.  
12. VDD is assumed to be 2.5V 0.2V. VDD power supply variation per cycle expected to be less than  
0.4V/400 cycle.  
Preliminary Data Sheet E0273E20 (Ver. 2.0)  
13  
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