CY62187EV30 MoBL®
Document History Page
Document Title: CY62187EV30 MoBL® 64-Mbit (4 M × 16) Static RAM
Document Number: 001-48998
Orig. of
Change
Submission
Date
Revision
ECN
Description of Change
**
2595932 VKN/PYRS
2644442 VKN/PYRS
2672650 VKN/PYRS
10/24/08
01/23/09
03/12/09
New Datasheet
*A
*B
Updated the Package diagram on page 10
Extended the VCC range to 3.7V
Added 55 ns speed bin and it’s related information
Changed ICC (typ) from 2.5 mA to 3.5 mA at f = 1 MHz
Changed ICC (max) from 4 mA to 6 mA at f = 1 MHz
For 70 ns speed, changed ICC (typ) form 33 mA to 28 mA at f = fMAX
For 70 ns speed, changed ICC (max) from 40 mA to 45 mA at f = fMAX
For 70 ns speed, changed tPWE from 45 to 50 ns, tSD from 30 to 35 ns
Modified footnote #6
Changed 48-Ball FBGA package dimensions from 8 x 9.5 x 1.6 mm to
8 x 9.5 x 1.4 mm and updated package diagram on page 10
*C
2737164 VKN/AESA
07/13/09
Converted from preliminary to final
Changed ICC(typ) from 3.5 mA to 4 mA at f = 1 MHz
Changed ICC(typ) from 35 mA to 45 mA and from 28 mA to 35 mA for the speeds
50 ns and 70 ns respectively at f = fmax
Included VCC range in the test condition of the “Electrical Characteristics” table
for the specs VOH, VOL, VIH, VIL
Changed VIL(max) from 0.8V to 0.7V for VCC = 2.7V to 3.7V
Changed CIN spec from 20 pF to 25 pF and COUT spec from 20 pF to 35 pF
Included thermal specs for 48-FBGA
Included VCC range for VTH spec in the AC test load table
Changed tLZBE spec from 5 ns to 10 ns
Added footnote #20 related to chip enable
*D
*E
2765892
3177000
VKN
AJU
09/18/09
Removed 70 ns speed
For 55 ns speed, at f = 1 MHz, changed ICC (max) spec from 6 mA to 9 mA
Changed ICC(typ) from 4 mA to 7.5 mA at f = 1 MHz
02/18/2011 Updated Features (Corrected ICC(typ) from 4 mA to 7.5 mA).
Updated Pin Configuration (Renamed Figure 1 as “48-ball FBGA”).
Updated Product Portfolio (Corrected ICC(typ) from 4 mA to 7.5 mA).
Updated Electrical Characteristics (Included BHE and BLE in ISB2 test
conditions to reflect Byte power down feature).
Updated Table 1 on page 5 (AC Test Loads).
Updated Data Retention Characteristics (Included BHE and BLE in ICCDR test
conditions to reflect Byte power down feature, corrected tR(min) from tRC to
55 ns).
Added Ordering Code Definitions.
Updated Package Diagram.
Added Acronyms and Units of Measure.
Changed all instances of IO to I/O.
Updated in new template.
Document Number: 001-48998 Rev. *E
Page 13 of 14
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