APPROVED PRODUCT
C9812
Low EMI Clock Generator for Intel 810E Chipset Systems
Test Mode Function
Test Mode Functionality
SEL2 SEL1
SEL0
CPU
SDRAM
3V66
PCI
48 MHz
REF
IOAPIC
x
0
1
TCLK/2
TCLK/2
TCLK/3
Table 2
TCLK/6
TCLK/2
TCLK
TCLK/6
Note: TCLK is a test clock over driven on the XIN input during test mode.
Power Management Functions
Power Management on this device is controlled by a single pin, PD# (pin32). When PD# is high (default) the device is in
running and all signals are active.
When PD# is asserted (forced) low, the device is in shutdown (or in power down) mode and all power supplies (3.3V and
2.5V except for VDDA/pin 27) may be removed. When in power down, all outputs are synchronously stopped in a low
state (see Fig.2 below), all PLL’s are shut off, and the crystal oscillator is disabled. When the device is shutdown the I²C
function is also disabled.
Power Management Timing
0nS
100MHz
10nS
20nS
30nS
40nS
50nS
CPU
3V66
66MHz
33MHz
33MHz
PCI
IOAPIC
PWRDN#
Undefined
Undefined
Undefined
SDRAM 100MHz
14.3MHz
48MHz
REF
USB
Fig.2
Power Management Current
Maximum 2.5 Volt Current
Consumption (VDD2.5 =2.625)
Maximum 3.3 Volt Current Consumption
(VDD3.3 = 3.465 V)
PD#, SEL[2..0]
(CPU Clock)
0XXX (Power down)
1010 (66MHz)
100 µA
70 mA
100 mA
200 µA
280 mA
280 mA
280 mA
1011 (100MHz)
111X (133MHz)
133 mA
Table 3
When exiting the power down mode, the designer must supply power to the VDD pins first, a minimum of 200mS before
releasing the PD# pin high.
Cypress Semiconductor Corporation
525 Los Coches St.
Document#: 38-07053 Rev. **
05/03/01
Milpitas, CA 95035. Tel: 408-263-6300, Fax: 408-263-6571
http://www.cypress.com
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