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SM045C156KHN650 参数 Datasheet PDF下载

SM045C156KHN650图片预览
型号: SM045C156KHN650
PDF下载: 下载PDF文件 查看货源
内容描述: AVX高级陶瓷电容器电源,高电压和Tip和Ring应用 [AVX Advanced Ceramic Capacitors for Power Supply, High Voltage and Tip and Ring Applications]
分类和应用: 电容器陶瓷电容器
文件页数/大小: 112 页 / 2013 K
品牌: KYOCERA AVX [ KYOCERA AVX ]
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SMPS Capacitors  
Assembly Guidelines  
®
If bonding the SupraCap to the board with adhesive, consider-  
Reliability  
ation of the CTE (coefficient of thermal expansion) is necessary.  
A mismatch between the CTE of the ceramic and adhesive can  
cause the ceramic to crack during temperature cycles.  
AVX has been involved in numerous military and customer High  
Reliability programs for over 40 years.  
Reliability [ꢀ Failure Rate (FRꢀ) or Mean Time Between Failure  
(MTBF)] is based on the number of failures and the cumulative  
test hours expanded by test versus use acceleration factors. The  
acceleration factors are calculated according to the following  
relationships:  
Processing Guidelines*  
There are practical size limitations for MLCs which prohibit reli-  
able direct mounting of chip capacitors larger than 2225 (.22" x  
.25") to a substrate. These large chips are subject to thermal  
shock cracking and thermal cycling solder joint fatigue. Even  
1812 (.18" x .12") and 2225 chip capacitors will have solder joint  
failures due to mechanical fatigue after 1500 thermal cycles  
from 0 to 85°C on FR4 and 3000 cycles on alumina from -55  
to 125°C. This is due to differences in the Coefficient of Thermal  
Expansion (CTE) between MLCs and substrate materials used in  
hybrids and surface mount assemblies. Materials used in the  
manufacture of all electronic components and substrates have  
wide ranges of CTEs as shown in Table 1.  
T
– T  
25  
T
U
Temperature  
Acceleration  
Where:  
= 10  
T
T
= test temp. (°C)  
= use temp. (°C)  
T
U
Voltage  
Acceleration  
V
V
3
Where:  
T
u
=
V
V
= test voltage  
= use voltage  
T
U
Military Reliability levels are usually expressed in terms of rated  
conditions versus test conditions (generally 125°C and 2X  
WVDC). If actual conditions are less than rated, the reliability lev-  
els will improve significantly over rated and can be calculated by  
use of the above relationship for determining accelerated test  
hours. For example, if the actual use conditions were 75°C and  
1/2 WVDC rating for a 125°C rated part, the acceleration factors  
are 64X for voltage and 100X for temperature. Reliabilities based  
on current testing can be obtained by contacting AVX.  
Table I  
CTEs of Typical Components and Substrates  
Material  
CTE (ppm/°C)  
5.3  
Alloy 42  
Alumina  
7  
Barium Titanate Capacitor Body  
Copper  
10-12  
17.6  
6-7  
General Processing Guidelines  
Soldering  
Copper Clad Invar  
Filled Epoxy Resin (<T )  
18-25  
18  
15  
R
FR4/G-10 PC Board (X, Y)  
Nickel or Steel  
The SM styles capacitors are generally quite large relative to  
other types of MLC capacitors. As a result of the size, precau-  
tions must be taken before subjecting the parts to any soldering  
operation in order to prevent thermal shock. Preheat prior to sol-  
Polyimide/Glass PCB (X, Y)  
Polyimide/Kevlar PCB (X, Y)  
Tantalum  
12  
7  
6.5  
®
dering is essential. The heating rate of the SupraCap ceramic  
bodies during preheat must not exceed 4°C/second. The preheat  
temperature must be within 50°C of the peak temperature  
reached by the ceramic bodies, adjacent to lead material, through  
the soldering process. The leads are attached to the chip stack  
with 10 / 88 / 2 (Sn / Pb / Ag, Solidus 268°C, Liquidus 290°C).  
Tin Lead Alloys  
27  
Linear Displacement  
This CTE difference translates into mechanical stress that is  
due to the linear displacement of substrate and component. Linear  
displacement is a function of CTE (CTE  
– CTE ) and the  
Vibration Specifications*  
sub  
comp  
overall length of the component. Long components/ substrates  
have large linear displacements even with a small CTE which will  
cause high stress in the solder joints and fatigue after a few tem-  
perature cycles. Figure 1 shows linear displacement for conditions  
where CTE is positive and negative.  
®
Due to the weight of the SupraCap and the size and strength of  
®
the lead frame used, when the SupraCap is to be used in an  
application where it will undergo high frequency vibration, we  
strongly recommend using our potted SM9 styles SupraCap .  
®
®
If other DIP styles SupraCap are to be used in a high frequency  
®
vibration environment, the SupraCap should be supported in  
some way to prevent oscillation of the capacitor assembly which  
®
will result in lead breakage. If “strapping” the SupraCap to the  
board is the chosen method of support, care should be taken  
not to chip the ceramic or apply undue pressure so that crack-  
ing of the ceramic results.  
* Reference AVX Technical Information paper, Processing Guidelines for  
SMPS Capacitors.”  
46  
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