+5 V
I
I
PULSE GEN.
= 50 Ω
V
1
2
3
4
8
7
6
5
CC
Z
O
t
= t = 5 ns
r
f
0.1µF
BYPASS
R
L
100
80
OUTPUT V
MONITORING
NODE
INPUT
MONITORING
NODE
O
V
I
= 5 V
CC
I = 7.5 mA
*C
L
t
, R = 4 KΩ
L
PLH
R
M
GND
t
, R = 350 Ω
L
PHL
1 KΩ
4 KΩ
60
40
*C IS APPROXIMATELY 15 pF WHICH INCLUDES
L
PROBE AND STRAY WIRING CAPACITANCE.
t
, R = 1 KΩ
L
PLH
I
= 7.50 mA
= 3.75 mA
I
I
t
, R = 350 Ω
L
PLH
INPUT
20
0
I
I
I
t
t
PHL
PLH
-60 -40 -20
0
20 40
80 100
60
OUTPUT
V
O
1.5 V
T
– TEMPERATURE – °C
A
Figure 6. Test circuit for tPHL and tPLH
.
Figure 7. Typical propagation delay vs.
temperature.
105
90
40
30
20
10
V
T
= 5 V
CC
= 25°C
R
= 4 kΩ
L
A
t
, R = 4 KΩ
L
PLH
V
I
= 5 V
CC
I = 7.5 mA
75
60
t
, R = 350 Ω
L
R
= 350 kΩ
PLH
L
t
, R = 1 KΩ
L
PLH
45
30
0
t
, R = 350 Ω
PHL
L
R
= 1 kΩ
L
1 KΩ
4 KΩ
-10
5
7
9
11
13
15
-60 -40 -20
0
20 40
80 100
60
I – PULSE INPUT CURRENT – mA
T
– TEMPERATURE – °C
I
A
Figure 8. Typical propagation delay vs. pulse
input current.
Figure 9. Typical pulse width distortion vs.
temperature.
PULSE GEN.
Z
= 50 Ω
r
O
INPUT V
MONITORING NODE
E
t
= t = 5 ns
f
+5 V
V
CC
1
8
7
6
5
7.5 mA
0.1 µF
BYPASS
R
L
2
3
4
I
I
120
OUTPUT V
MONITORING
NODE
O
V
V
V
= 5 V
= 3 V
= 0 V
CC
EH
EL
*C
L
I = 7.5 mA
I
90
60
GND
t
, R = 4 kΩ
L
ELH
*C IS APPROXIMATELY 15 pF WHICH INCLUDES
L
PROBE AND STRAY WIRING CAPACITANCE.
t
, R = 1 kΩ
ELH
L
3.0 V
1.5 V
INPUT
30
0
t
, R = 350 Ω
ELH
L
V
E
t
t
EHL
ELH
t
, R = 350 Ω, 1 kΩ, 4 kΩ
L
EHL
OUTPUT
-60 -40 -20
0
20 40 60 80 100
V
O
1.5 V
T
– TEMPERATURE – °C
A
Figure 10. Test circuit for tEHL and tELH
.
Figure 11. Typical enable propagation delay
vs. temperature.
10
AVAGO [ AVAGO TECHNOLOGIES LIMITED ]
