Figure 16. Sequential Timing – Waveforms and Block Diagram
Notes
1. Minimum DC input is -0.5V, however inputs may under-shoot to -2.0V
for periods less than 20ns.
13. “Async. Clock” refers to the clock from the Sum term (OR gate).
14. The “LCC” term indicates that the timing parameter is applied to the
LCC register. The “LCC/IOC” term indicates that the timing
parameter is applied to both the LCC and IOC registers. The
“LCC/IOC/INC” term indicates that the timing parameter is applied to
the LCC, IOC, and INC registers.
2.Test points for Clock and VCC in tR,tF,tCL,tCH, and tRESET are referenced at
10% and 90% levels.
3. I/O pins are 0V or VCC.
4. Test one output at a time for a duration of less than 1 sec.
5. Capacitances are tested on a sample basis.
15. This refers to the Sum-D gate routed to the IOC register for an
additional buried register.
6. Test conditions assume: signal transition times of 5ns or less from the
10% and 90% points, timing reference levels of 1.5V (unless
otherwise specified).
16. The term “input” without any reference to another term refers to an
(external) input pin.
7. tOE is measured from input transition to VREF ±0.1V (See test loads at
end of Section 6 for VREF value). tOD is measured from input transition
to VOH -0.1V or VOL +0.1V.
17. The parameter t
indicates that the PCLK signal to the IOC register
SPI
is always slower than the data from the pin or input by the absolute
value of (t -t -t ). This means that no set-up time for the data
SK PK IA
8. DIP: “System-clock” refers to pin 1/21 high speed clocks. PLCC: “Sys-
tem-clock” refers to pin 2/24 high speed clocks.
from the pin or input is required, i.e. the external data and clock can
be sent to the device simultaneously. Additionally, the data from the
9. For T or JK registers in toggle (divide by 2) operation only.
10. For combinatorial and async-clock to LCC output delay.
11. ICC for a typical application: This parameter is tested with the device
programmed as a 10-bit D-type counter.
pin must remain stable for t
arrive at the IOC register.
time, i.e. to wait for the PCLK signal to
HPI
18. Typical (typ) ICC is measured at T = 25° C, freq = 25MHZ, V
=
CC
A
12. Test loads are specified in Section 5 of this Data Book.
5V
Anachip Corp.
www.anachip.com.tw
Rev. 1.0 Dec 16, 2004
9/10
ANACHIP [ ANACHIP CORP ]
