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EPM240T100C5 参数 Datasheet PDF下载

EPM240T100C5图片预览
型号: EPM240T100C5
PDF下载: 下载PDF文件 查看货源
内容描述: [最大II器件]
分类和应用: 可编程逻辑器件输入元件PC
文件页数/大小: 295 页 / 3815 K
品牌: ALTERA [ ALTERA CORPORATION ]
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Chapter 13: IEEE 1149.1 (JTAG) Boundary-Scan Testing for MAX II Devices  
13–13  
IEEE Std. 1149.1 BST Operation Control  
EXTESTselects data differently than SAMPLE/PRELOAD. EXTESTchooses data from  
the update registers as the source of the output and output enable signals. Once the  
EXTESTinstruction code is entered, the multiplexers select the update register data;  
thus, data stored in these registers from a previous EXTESTor SAMPLE/PRELOADtest  
cycle can be forced onto the pin signals. In the capture phase, the results of this test  
data are stored in the capture registers and then shifted out of TDOduring the shift  
phase. New test data can then be stored in the update registers during the update  
phase.  
The waveform diagram in Figure 13–11 resembles the SAMPLE/PRELOADwaveform  
diagram, except that the instruction code for EXTESTis different. The data shifted out  
of TDOconsists of the data that was present in the capture registers after the capture  
phase. New test data shifted into the TDIpin appears at the TDOpin after being  
clocked through the entire boundary-scan register.  
Figure 13–11. EXTEST Shift Data Register Waveforms  
TCK  
TMS  
TDI  
TDO  
SHIFT_IR  
TAP_STATE  
SHIFT_DR  
EXIT1_IR  
UPDATE_IR  
EXIT1_DR  
SELECT_DR_SCAN  
After boundry-scan  
register data has been  
shifted out, data  
entered into TDI will  
shift out of TDO.  
Data stored in  
boundary-scan  
register is shifted  
out of TDO.  
Instruction Code  
UPDATE_DR  
CAPTURE_DR  
BYPASS Instruction Mode  
The BYPASSinstruction mode is activated with an instruction code made up of only  
ones. The waveforms in Figure 13–12 show how scan data passes through a device  
once the TAP controller is in the SHIFT_DRstate. In this state, data signals are clocked  
into the bypass register from TDIon the rising edge of TCKand out of TDOon the  
falling edge of the same clock pulse.  
Figure 13–12. BYPASS Shift Data Register Waveforms  
TCK  
TMS  
Bit 1  
Bit 2  
Bit 1  
Bit 3  
Bit 2  
TDI  
Bit n  
TDO  
SHIFT_IR  
TAP_STATE  
SHIFT_DR  
SELECT_DR_SCAN  
EXIT1_DR  
UPDATE_DR  
EXIT1_IR  
Data shifted into TDI on  
the rising edge of TCK is  
shifted out of TDO on the  
falling edge of the same  
TCK pulse.  
UPDATE_IR  
CAPTURE_DR  
Instruction Code  
© October 2008 Altera Corporation  
MAX II Device Handbook  
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