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EP2C8T144I8N 参数 Datasheet PDF下载

EP2C8T144I8N图片预览
型号: EP2C8T144I8N
PDF下载: 下载PDF文件 查看货源
内容描述: Cyclone II器件手册,卷1 [Cyclone II Device Handbook, Volume 1]
分类和应用: 现场可编程门阵列可编程逻辑时钟
文件页数/大小: 470 页 / 5765 K
品牌: ALTERA [ ALTERA CORPORATION ]
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IEEE Std. 1149.1 Boundary-Scan Register  
operate the TAP controller, and the TDIand TDOpins provide the serial  
path for the data registers. The TDIpin also provides data to the  
instruction register, which then generates control logic for the data  
registers.  
The boundary-scan register is a large serial shift register that uses the TDI  
pin as an input and the TDOpin as an output. The boundary-scan register  
consists of 3-bit peripheral elements that are associated with Cyclone II  
I/O pins. You can use the boundary-scan register to test external pin  
connections or to capture internal data.  
IEEE Std. 1149.1  
Boundary-Scan  
Register  
f
See the Configuration & Testing chapter in Volume 1 of the Cyclone II  
Device Handbook for the Cyclone II device boundary-scan register  
lengths.  
Figure 14–3 shows how test data is serially shifted around the periphery  
of the IEEE Std. 1149.1 device.  
Figure 14–3. Boundary-Scan Register  
Each peripheral  
element is either an  
I/O pin, dedicated  
input pin, or  
Internal Logic  
dedicated  
configuration pin.  
TAP Controller  
TDI  
TMS  
TDO  
TCK  
Boundary-Scan Cells of a Cyclone II Device I/O Pin  
The Cyclone II device 3-bit boundary-scan cell (BSC) consists of a set of  
capture registers and a set of update registers. The capture registers can  
connect to internal device data via the OUTJand OEJsignals, and connect  
14–4  
Altera Corporation  
Cyclone II Device Handbook, Volume 1  
February 2007  
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