欢迎访问ic37.com |
会员登录 免费注册
发布采购

EP1AGX50DF780C6 参数 Datasheet PDF下载

EP1AGX50DF780C6图片预览
型号: EP1AGX50DF780C6
PDF下载: 下载PDF文件 查看货源
内容描述: [Field Programmable Gate Array, 50160 CLBs, 640MHz, PBGA780, 29 X 29 MM, 1 MM PITCH, FBGA-780]
分类和应用: 现场可编程门阵列可编程逻辑LTE时钟
文件页数/大小: 296 页 / 3505 K
品牌: ALTERA [ ALTERA CORPORATION ]
 浏览型号EP1AGX50DF780C6的Datasheet PDF文件第138页浏览型号EP1AGX50DF780C6的Datasheet PDF文件第139页浏览型号EP1AGX50DF780C6的Datasheet PDF文件第140页浏览型号EP1AGX50DF780C6的Datasheet PDF文件第141页浏览型号EP1AGX50DF780C6的Datasheet PDF文件第143页浏览型号EP1AGX50DF780C6的Datasheet PDF文件第144页浏览型号EP1AGX50DF780C6的Datasheet PDF文件第145页浏览型号EP1AGX50DF780C6的Datasheet PDF文件第146页  
Configuration and Testing  
1
Arria GX, Stratix®, Stratix II, Stratix GX, Stratix II GX,  
Cyclone® II, and Cyclone devices must be within the first 17  
devices in a JTAG chain. All of these devices have the same JTAG  
controller. If any of the Stratix, Arria GX, Cyclone, and  
Cyclone II devices are in the 18th or further position, they will  
fail configuration. This does not affect the functionality of the  
SignalTap II embedded logic analyzer.  
Table 3–1. Arria GX JTAG Instructions (Part 1 of 2)  
JTAG Instruction  
Instruction Code  
Description  
00 0000 0101  
Allows a snapshot of signals at the device pins to be captured  
and examined during normal device operation and permits an  
initial data pattern to be output at the device pins. Also used by  
the SignalTap II embedded logic analyzer.  
SAMPLE/PRELOAD  
00 0000 1111  
11 1111 1111  
Allows external circuitry and board-level interconnects to be  
tested by forcing a test pattern at the output pins and capturing  
test results at the input pins.  
EXTEST (1)  
BYPASS  
Places the 1-bit bypass register between the TDIand TDO  
pins, which allows the BST data to pass synchronously  
through selected devices to adjacent devices during normal  
device operation.  
00 0000 0111  
USERCODE  
Selects the 32-bit USERCODEregister and places it between  
the TDIand TDOpins, allowing the USERCODEto be serially  
shifted out of TDO.  
00 0000 0110  
00 0000 1011  
IDCODE  
Selects the IDCODEregister and places it between TDIand  
TDO, allowing IDCODEto be serially shifted out of TDO.  
HIGHZ (1)  
Places the 1-bit bypass register between the TDIand TDO  
pins, which allows the BST data to pass synchronously  
through selected devices to adjacent devices during normal  
device operation, while tri-stating all of the I/O pins.  
00 0000 1010  
CLAMP (1)  
Places the 1-bit bypass register between the TDIand TDO  
pins, which allows the BST data to pass synchronously  
through selected devices to adjacent devices during normal  
device operation while holding I/O pins to a state defined by  
the data in the boundary-scan register.  
Used when configuring an Arria GX device via the JTAG port  
with a USB-Blaster™, MasterBlaster™, ByteBlasterMV™, or  
ByteBlaster II download cable, or when using a .jam or .jbc via  
ICR instructions  
PULSE_NCONFIG  
an embedded processor or JRunnerTM  
.
00 0000 0001  
Emulates pulsing the nCONFIGpin low to trigger  
reconfiguration even though the physical pin is unaffected.  
3–2  
Altera Corporation  
May 2008  
Arria GX Device Handbook, Volume 1  
 复制成功!