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DSF10K 参数 Datasheet PDF下载

DSF10K图片预览
型号: DSF10K
PDF下载: 下载PDF文件 查看货源
内容描述: 嵌入式可编程逻辑系列 [EMBEDDED PROGRAMMABLE LOGIC FAMILY]
分类和应用: 可编程逻辑
文件页数/大小: 138 页 / 1955 K
品牌: ALTERA [ ALTERA CORPORATION ]
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FLEX 10K Embedded Programmable Logic Family Data Sheet  
Table 39. External Bidirectional Timing Parameters  
Note (10)  
Symbol  
Parameter  
Condition  
t
t
t
t
t
Setup time for bidirectional pins with global clock at adjacent LE register  
Hold time for bidirectional pins with global clock at adjacent LE register  
Clock-to-output delay for bidirectional pins with global clock at IOE register  
Synchronous IOE output buffer disable delay  
INSUBIDIR  
INHBIDIR  
OUTCOBIDIR  
XZBIDIR  
Synchronous IOE output buffer enable delay, slow slew rate = off  
ZXBIDIR  
Notes to tables:  
(1) Microparameters are timing delays contributed by individual architectural elements. These parameters cannot be  
measured explicitly.  
(2) Operating conditions:  
VCCIO = 5.0 V ± 5% for commercial use in FLEX 10K devices.  
VCCIO = 5.0 V ± 10% for industrial use in FLEX 10K devices.  
VCCIO = 3.3 V ± 10% for commercial or industrial use in FLEX 10KA devices.  
VCCIO = 3.3 V ± 10% for commercial or industrial use in FLEX 10K devices.  
VCCIO = 2.5 V ± 0.2 V for commercial or industrial use in FLEX 10KA devices.  
VCCIO = 2.5 V, 3.3 V, or 5.0 V.  
(3) Operating conditions:  
(4) Operating conditions:  
(5) Because the RAM in the EAB is self-timed, this parameter can be ignored when the WEsignal is registered.  
(6) EAB macroparameters are internal parameters that can simplify predicting the behavior of an EAB at its boundary;  
these parameters are calculated by summing selected microparameters.  
(7) These parameters are worst-case values for typical applications. Post-compilation timing simulation and timing  
analysis are required to determine actual worst-case performance.  
(8) External reference timing parameters are factory-tested, worst-case values specified by Altera. A representative  
subset of signal paths is tested to approximate typical device applications.  
(9) Contact Altera Applications for test circuit specifications and test conditions.  
(10) These timing parameters are sample-tested only.  
Altera Corporation  
61  
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