MIL-PRF-38535K
JEDEC – SOLID STATE TECHNOLOGY ASSOCIATION (JEDEC)
JESD471
- Symbol & Label for Electrostatic Sensitive Devices.
JEP121
- Requirements for Microelectronic Screening and Test Optimization.
- Accelerated Moisture Resistance - Unbiased Autoclave.
- Highly Accelerated Temperature and Humidity Stress Test (HAST) - biased
- Highly Accelerated Temperature and Humidity Stress Test (HAST) - unbiased
- Electrostatic Discharge (ESD) Sensitivity Testing Human Body Model (HBM)
- External Visual.
JESD22-A102
JESD22-A110
JESD22-A118
JESD22-A114
JESD22-B101
JESD31
- General Requirements for Distributors of Commercial and Military Semiconductor Devices.
- Requirements for Handling Electrostatic-Discharge-Sensitive (ESDS) Devices.
JESD625
(Copies of these documents are available online at http://www.jedec.org or from JEDEC – Solid State Technology
Association, 3103 North 10th Street, Suite 240–S, Arlington, VA 22201-2107.)
2.4 Order of precedence. Unless otherwise noted herein or in the contract, in the event of a conflict between the text of this
document and the references cited herein (except for related specification sheets), the text of this document takes
precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has
been obtained.
3. REQUIREMENTS
3.1 General. The manufacturer of QML microcircuits in compliance with this specification shall have or have access to and
use of production and test facilities, and a QM program to assure successful compliance with the provisions of this
specification. All microcircuits manufactured on a QML line shall be processed on a QA certified fabrication line, and shall be
assembled on a QA certified assembly line. All microcircuits shall be electrically capable of meeting parameters over the
specified temperature range in accordance with the device specification in a QA certified test facility. The QML manufacturer
shall be capable of demonstrating their ability to develop hardware and software test programs before delivery of the product.
The QML certification mark (3.6.3) indicates compliance to all the performance provisions of this specification. The
requirements described herein shall be addressed in one of two ways. These are as follows:
a. As specified herein.
b. Demonstration to the qualifying activity (QA) and validation team when applicable, of an alternate method, that assures
at least the same level of quality and reliability as defined by the requirements herein, or demonstration to the QA that
the requirement is not applicable to the manufacturer's technology.
NOTE: A QML manufacturer may modify screening and Technology Conformance Inspection (TCI) requirements of the
device specification or Standard Microcircuit Drawing (SMD) under special criteria defined within this specification and as
defined in the manufacturer's QM plan. (For guidance on screening and QCI optimization see JEP121 - Requirements for
Microelectronic Screening and Test Optimization and J.3.12 herein.) These changes cannot affect any thermal, mechanical,
electrical parameters, or radiation levels (when applicable) which affect form, fit, or function of the device, defined within the
device specification or SMD.
3.1.1 Reference to applicable device specification. For purposes of this specification, when the term "as specified" is used
without additional reference to a specific location or document, the intended reference shall be to the device specification.
3.2 Item requirements. The individual item requirements, including temperature range, for integrated circuits delivered
under this specification shall be documented in the device specification prepared in accordance with 3.5 herein. Devices
produced under this specification may have any operating temperature range (case, ambient, or junction) as long as it is
specified in the device specification, and any references to minimum or maximum operating temperatures shall refer to the
respective lower and upper limits of this range. However, the manufacturer shall demonstrate the operating temperature
range (case, ambient, or junction) capability of the technology being offered. The standard evaluation circuit (SEC) is typically
used for this demonstration.
3
ACTEL [ Actel Corporation ]
