Pre-Production
WM8850
Test Conditions
AVDD = CPVDD = 5V, DBVDD = 3.3V, DCVDD = 1.8V, TA = +25oC, 1kHz signal, fs = 48kHz, 24-bit data unless otherwise stated.
PARAMETER
SYMBOL
TEST CONDITIONS
MIN
TYP
MAX
UNIT
DAC2 Path Performance (VOUT2LP, VOUT2LN, VOUT2RP and VOUT2N into 10kΩ Line Load)
DAC3 Path Performance (VOUT3LP, VOUT3LN, VOUT3RP and VOUT3N into 10kΩ Line Load)
Unweighted
103
106
106
80
dB
dB
dB
dB
dB
dB
dB
dB
Signal to Noise Ratio
SNR
A-weighted
100
A-weighted
fs=96kHz
Fs >
11.025kHz
Out of Band Signal to
Noise Ratio (0.6fs to
150kHz)
OBSNR
DNR
Fs <=
11.025kHz
75
A-weighted
-60dBFS
Dynamic Range
106
-92
-92
0dBFS
Total Harmonic Distortion
THD
0dBFS
fs=96kHz
Channel Separation
20Hz to 20kHz
0dBFS
102
0.1
dB
dB
°
Channel Level Matching
Channel Phase Deviation
0.01
75
1kHz, 100mVpp on AVDD
dB
dB
AVDD Power Supply
Rejection Ratio
AVDD
PSRR
20Hz to 20kHz, 100mVpp on AVDD
55
PP, April 2011, Rev 3.2
21
w
WOLFSON [ WOLFSON MICROELECTRONICS PLC ]
