WM8850
Pre-Production
Test Conditions
AVDD = CPVDD = 5V, DBVDD = 3.3V, DCVDD = 1.8V, TA = +25oC, 1kHz signal, fs = 48kHz, 24-bit data unless otherwise stated.
PARAMETER
SYMBOL
TEST CONDITIONS
MIN
TYP
MAX
UNIT
Analogue References
Positive Voltage
Reference
0.9 *
AVDD
VREFP
VREFN
VMID
V
V
Negative Voltage
Reference
0.1 *
AVDD
0.5 *
AVDD
Midrail Voltage Reference
Charge Pump Cap Level
V
CPCAP
3.15
12.5
75
V
AVDD to VMID or VMID to AGND
VMID_SEL[1:0]=00
kΩ
kΩ
kΩ
kΩ
AVDD to VMID or VMID to AGND
VMID_SEL[1:0]=01
Midrail Voltage
Resistance
RVMID
AVDD to VMID or VMID to AGND
VMID_SEL[1:0]=10
37.5
375
AVDD to VMID or VMID to AGND
VMID_SEL[1:0]=11
Digital Input / Output
0.65 *
DBVDD
Input High Level
VIH
VIL
V
V
0.35 *
DBVDD
Input Low Level
Output High Level
Output Low Level
Input Capacitance
Input Leakage
0.9 *
DBVDD
VOH
V
0.1 *
DBVDD
VOL
V
7.5
pF
µA
-0.1
+0.1
PP, April 2011, Rev 3.2
24
w
WOLFSON [ WOLFSON MICROELECTRONICS PLC ]
