Pre-Production
WM8850
Test Conditions
AVDD = CPVDD = 5V, DBVDD = 3.3V, DCVDD = 1.8V, TA = +25oC, 1kHz signal, fs = 48kHz, 24-bit data unless otherwise stated.
PARAMETER
SYMBOL
TEST CONDITIONS
MIN
TYP
MAX
UNIT
DAC1 Path Performance (VOUT1L and VOUT1R into 10kΩ Line Load)
Unweighted
105
108
108
80
dB
dB
dB
dB
dB
dB
dB
dB
Signal to Noise Ratio
SNR
A-weighted
100
A-weighted
fs=96kHz
Fs >
11.025kHz
Out of Band Signal to
Noise Ratio (0.6fs to
150kHz)
OBSNR
DNR
Fs <=
11.025kHz
75
A-weighted
-60dBFS
Dynamic Range
108
-96
-96
0dBFS
-85
-85
Total Harmonic Distortion
THD
0dBFS
fs=96kHz
1kHz
20Hz to 20kHz
0dBFS
115
110
0.1
0.01
51
dB
dB
dB
°
Channel Separation
Channel Level Matching
Channel Phase Deviation
1kHz, 100mVpp on AVDD
20Hz to 20kHz, 100mVpp on AVDD
1kHz, 100mVpp on CPVDD
dB
dB
dB
dB
AVDD Power Supply
Rejection Ratio
AVDD
PSRR
50
86
CPVDD Power Supply
Rejection Ratio
CPVDD
PSRR
20Hz to 20kHz, 100mVpp on CPVDD
75
PP, April 2011, Rev 3.2
19
w
WOLFSON [ WOLFSON MICROELECTRONICS PLC ]
