欢迎访问ic37.com |
会员登录 免费注册
发布采购

W9825G6KH-6 参数 Datasheet PDF下载

W9825G6KH-6图片预览
型号: W9825G6KH-6
PDF下载: 下载PDF文件 查看货源
内容描述: [Synchronous DRAM, 16MX16, 5ns, CMOS, PDSO54, TSOP2-54]
分类和应用: 动态存储器光电二极管内存集成电路
文件页数/大小: 42 页 / 714 K
品牌: WINBOND [ WINBOND ]
 浏览型号W9825G6KH-6的Datasheet PDF文件第1页浏览型号W9825G6KH-6的Datasheet PDF文件第2页浏览型号W9825G6KH-6的Datasheet PDF文件第3页浏览型号W9825G6KH-6的Datasheet PDF文件第4页浏览型号W9825G6KH-6的Datasheet PDF文件第6页浏览型号W9825G6KH-6的Datasheet PDF文件第7页浏览型号W9825G6KH-6的Datasheet PDF文件第8页浏览型号W9825G6KH-6的Datasheet PDF文件第9页  
W9825G6KH  
5. PIN DESCRIPTION  
PIN NUMBER PIN NAME  
FUNCTION  
DESCRIPTION  
A0A8Multiplexed pins for row and column address.  
Row address: A0A12. Column address: A0A8.  
2326, 22,  
A0A12  
2936  
Address  
Select bank to activate during row address latch time, or  
bank to read/write during address latch time.  
20, 21  
BS0, BS1  
Bank Select  
2, 4, 5, 7, 8, 10,  
11, 13, 42, 44,  
45, 47, 48, 50,  
51, 53  
Data  
Input/Output  
Multiplexed pins for data output and input.  
DQ0DQ15  
Disable or enable the command decoder. When  
19  
18  
Chip Select command decoder is disabled, new command is  
ignored and previous operation continues.  
CS  
Command input. When sampled at the rising edge of  
Row Address  
RAS  
the clock, RAS ,  
CAS and WE define the  
operation to be executed.  
Strobe  
Column  
Address  
Strobe  
17  
16  
CAS  
WE  
Referred to RAS  
Write Enable  
Referred to RAS  
The output buffer is placed at Hi-Z(with latency of 2)  
LDQM,  
UDQM  
Input/Output when DQM is sampled high in read cycle. In write  
15, 39  
Mask  
cycle, sampling DQM high will block the write  
operation with zero latency.  
System clock used to sample inputs on the rising edge  
of clock.  
38  
37  
CLK  
CKE  
Clock Inputs  
CKE controls the clock activation and deactivation.  
Clock Enable When CKE is low, Power Down mode, Suspend mode,  
or Self Refresh mode is entered.  
1, 14, 27  
VDD  
VSS  
Power  
Ground  
Power  
Power for input buffers and logic circuit inside DRAM.  
Ground for input buffers and logic circuit inside DRAM.  
Separated power from VDD, to improve DQ noise  
28, 41, 54  
3, 9, 43, 49  
VDDQ  
for I/O Buffer immunity.  
Ground  
for I/O Buffer immunity.  
Separated ground from VSS, to improve DQ noise  
6, 12, 46, 52  
40  
VSSQ  
NC  
No Connection No connection.  
Publication Release Date: Sep. 01, 2014  
Revision: A02  
- 5 -  
 复制成功!