6N137 / VO2601 / 11 / VO2630 / 31 / VO4661
Vishay Semiconductors
Input V
Monitoring Node
Pulse Gen.
E
V
CC
Z
t
= 50 Ω
= t = 5 ns
r
o
f
Single Channel
V
R
1
2
3
4
CC
8
7
6
5
L
3 V
V
E
7.5 mA
Output V
Monitoring
Node
O
1.5 V
Input V
E
0.1 µF
Bypass
I
F
t
EHL
V
OUT
t
ELH
C
= 15 pF
Output V
L
O
1.5 V
GND
The Probe and Jig Capacitances are included in C
L
18975-2
Figure 3. Single Channel Test Circuit for tEHL and tELH
Common Mode Transient Immunity
Parameter
Test condition
Symbol
Min
100
Typ.
Max
Unit
Common mode
transient immunity
(high)
|VCM| = 10 V, VCC = 5 V, IF = 0 mA,
VO(min) = 2 V, RL = 350 Ω, Tamb = 25 °C 1)
| CMH
|
V/µs
|VCM| = 50 V, VCC = 5 V, IF = 0 mA,
VO(min) = 2 V, RL = 350 Ω, Tamb = 25 °C 2)
| CMH
| CMH
|
|
5000
10000
100
10000
15000
V/µs
V/µs
V/µs
V/µs
V/µs
|VCM| = 1 kV, VCC = 5 V, IF = 0 mA,
VO(min) = 2 V, RL = 350 Ω, Tamb = 25 °C 3)
|VCM| = 10 V, VCC = 5 V, IF = 7.5 mA,
VO(max) = 0.8 V, RL = 350 Ω, Tamb = 25 °C 1)
|VCM| = 50 V, VCC = 5 V, IF = 7.5 mA,
VO(max) = 0.8 V, RL = 350 Ω, Tamb = 25 °C 2)
|VCM| = 1 kV, VCC = 5 V, IF = 7.5 mA,
VO(max) = 0.8 V, RL = 350 Ω, Tamb = 25 °C 3)
| CML |
| CML |
| CML |
5000
10000
10000
15000
1) For 6N137 and VO2630
2) For VO2601 and VO2631
3) For VO2611 and VO4661
V
CC
I
Single Channel
V
F
(PEAK)
V
R
CM
1
2
3
4
CC 8
L
V
CM
0 V
B
A
V
E
Output V
Monitoring
Node
O
=
Switch AT A:I
0 mA
7
6
5
F
0.1 µF
Bypass
V
OUT
CM
V
5 V
H
O
)
(min.
V
V
O
FF
=
Switch AT A:
7.5 mA
I
F
(max.)
V
O
GND
CM
V
O
V
0.5
L
V
-
CM
+
Pulse Generator
= 50 Ω
18976-2
Z
O
Figure 4. Single Channel Test Circuit for Common Mode Transient Immunity
Document Number 84732
Rev. 1.0, 07-Jun-05
www.vishay.com
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