SCES415N – NOVEMBER 2002 – REVISED DECEMBER 2013
Absolute Maximum Ratings
(1)
over operating free-air temperature range (unless otherwise noted)
MIN
V
CC
V
I
V
O
V
O
I
IK
I
OK
I
O
Supply voltage range
Input voltage range
(2)
MAX
6.5
6.5
6.5
V
CC
+ 0.5
–50
–50
±50
±100
UNIT
V
V
V
V
mA
mA
mA
mA
–0.5
–0.5
–0.5
–0.5
(2) (3)
Voltage range applied to any output in the high-impedance or power-off state
(2)
Voltage range applied to any output in the high or low state
Input clamp current
Output clamp current
Continuous output current
Continuous current through V
CC
or GND
DBV package
DCK package
DRL package
YZP package
V
I
< 0
V
O
< 0
165
259
142
123
–65
150
°C
°C/W
θ
JA
Package thermal impedance
(4)
T
stg
(1)
(2)
(3)
(4)
Storage temperature range
Stresses beyond those listed under "absolute maximum ratings" may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under "recommended operating
conditions" is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
The input negative-voltage and output voltage ratings may be exceeded if the input and output current ratings are observed.
The value of V
CC
is provided in the recommended operating conditions table.
The package thermal impedance is calculated in accordance with JESD 51-7.
Recommended Operating Conditions
(1)
MIN
V
CC
V
I
V
O
Supply voltage
Input voltage
Output voltage
V
CC
= 1.65 V
V
CC
= 2.3 V
I
OH
High-level output current
V
CC
= 3 V
V
CC
= 4.5 V
V
CC
= 1.65 V
V
CC
= 2.3 V
I
OL
Low-level output current
V
CC
= 3 V
V
CC
= 4.5 V
T
A
(1)
Operating free-air temperature
–40
Operating
Data retention only
1.65
1.5
0
0
5.5
V
CC
–4
–8
–16
–24
–32
4
8
16
24
32
125
°C
mA
mA
MAX
5.5
UNIT
V
V
V
All unused inputs of the device must be held at V
CC
or GND to ensure proper device operation. Refer to the TI application report,
Implications of Slow or Floating CMOS Inputs,
literature number
4
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