MSP430F41x2
MIXED SIGNAL MICROCONTROLLER
SLAS648E -- APRIL 2009 -- REVISED MARCH 2011
Terminal Functions (continued)
TERMINAL
NO.
I/O
DESCRIPTION
NAME
64
48
PIN
PIN
P7.3/TCK/S35
57
41
I/O General-purpose digital I/O pin
Test clock input for device programming and test
LCD segment output
General-purpose digital I/O pin
Timer1_A5, capture: CCI4B input, compare: Out4 output
ADC10 analog input A0
P7.4/TA1.4/
A0/CA2
60
44
I/O
I/O
Comparator_A input 2
General-purpose digital I/O pin
Timer1_A5, capture: CCI3B input, compare: Out3 output
ADC10 analog input A1
P7.5/TA1.3/
A1/CA3
61
45
45
--
Comparator_A input 3
General-purpose digital I/O pin
I/O Timer0_A3, capture: CCI2A input, compare: Out2 output
LCD segment output
P7.6/TA0.2/S25
AV
AV
64
62
7
48
46
3
Analog supply voltage, positive terminal
CC
SS
Analog supply voltage, negative terminal
DV
DV
Digital supply voltage, positive terminal. Supplies all digital parts.
Digital supply voltage, negative terminal. Supplies all digital parts.
CC
SS
10
9
6
XOUT
XIN
5
O
I
Output port for crystal oscillator XT1. Standard or watch crystals can be connected.
Input port for crystal oscillator XT1. Standard or watch crystals can be connected.
8
4
RST/NMI/
SBWTDIO
58
42
I
Reset or nonmaskable interrupt input
Spy-Bi-Wire test data input/output during programming and test
TEST/SBWTCLK
Thermal Pad
59
43
I
Selects test mode for JTAG pins on Port7. The device protection fuse is connected to TEST.
NA
NA
NA QFN package pad (RGZ package only). Connection to DV is recommended.
SS
9
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