MSP430G2955
MSP430G2855
MSP430G2755
SLAS800 –MARCH 2013
www.ti.com
Table 2. Terminal Functions (continued)
TERMINAL
NAME
NO.
I/O
DESCRIPTION
DA
RHA
P4.3/
TB0.0/
A12/
General-purpose digital I/O pin
Timer_B, capture: CCI0B input, compare: OUT0 output
ADC10 analog input A12
20
18
I/O
CA3
Comparator_A+, CA3 input
P4.4/
TB0.1/
A13/
General-purpose digital I/O pin
Timer_B, capture: CCI1B input, compare: OUT1 output
ADC10 analog input A13
21
22
19
20
I/O
I/O
CA4
Comparator_A+, CA4 input
P4.5/
TB0.2/
A14/
General-purpose digital I/O pin
Timer_B, compare: OUT2 output
ADC10 analog input A14
CA5
Comparator_A+, CA5 input
P4.6/
TBOUTH/
CAOUT/
A15/
General-purpose digital I/O pin
Timer_B, switch all TB0 to TB3 outputs to high impedance
Comparator_A+ Output
23
24
21
22
I/O
I/O
ADC10 analog input A15
CA6
Comparator_A+, CA6 input
P4.7/
TBCLK/
CAOUT/
CA7
General-purpose digital I/O pinCB0
Timer_B, clock signal TBCLK input
Comparator_A+ Output
Comparator_A+, CA7 input
RST/
Reset or nonmaskable interrupt input
Spy-Bi-Wire test data input/output during programming and test
7
1
5
I
I
NMI/SBWTDIO
TEST/
Selects test mode for JTAG pins on Port 1. The device protection fuse is
connected to TEST.
37
SBWTCK
DVCC
Spy-Bi-Wire test clock input during programming and test
Digital supply voltage
2
16
4
38, 39
14
AVCC
Analog supply voltage
DVSS
1, 4
13
Digital ground reference
AVSS
15
NA
Analog ground reference
QFN Pad
Pad
NA
QFN package pad; connection to DVSS recommended.
6
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