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BQ2011K 参数 Datasheet PDF下载

BQ2011K图片预览
型号: BQ2011K
PDF下载: 下载PDF文件 查看货源
内容描述: 电量监测计IC,用于高放电速率 [Gas Gauge IC for High Discharge Rates]
分类和应用: 仪表
文件页数/大小: 20 页 / 174 K
品牌: TI [ TEXAS INSTRUMENTS ]
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bq2011K  
ternal bq2011K registers when VCC momentarily drops be-  
low 3.0V. VCC is output on RBI when VCC is above 3.0V.  
TMPGG (hex)  
Temperature Range  
< -30°C  
0x  
1x  
2x  
3x  
4x  
5x  
6x  
7x  
8x  
9x  
Ax  
Bx  
Cx  
After VCC rises above 3.0V, the bq2011K checks the internal  
registers for data loss or corruption. If data has changed,  
then the NAC register is cleared, and the LMD register is  
loaded with the initial PFC.  
-30°C to -20°C  
-20°C to -10°C  
-10°C to 0°C  
0°C to 10°C  
10°C to 20°C  
20°C to 30°C  
30°C to 40°C  
40°C to 50°C  
50°C to 60°C  
60°C to 70°C  
70°C to 80°C  
> 80°C  
Voltage Thresholds  
In conjunction with monitoring VSR for charge/discharge  
currents, the bq2011K monitors the single-cell battery po-  
tential through the SB pin. The single-cell voltage poten-  
tial is determined through a resistor-divider network per  
the following equation:  
RB1  
RB2  
= N 1  
where N is the number of cells, RB1 is connected to the  
positive battery terminal, and RB2 is connected to the  
negative battery terminal. The single-cell battery volt-  
age is monitored for the end-of-discharge voltage (EDV)  
and for maximum cell voltage (MCV). The EDV thresh-  
old level is used to determine when the battery has  
reached an “empty” state, and the MCV threshold is used  
for fault detection during charging. The MCV threshold  
for the bq2011K is fixed at:  
Layout Considerations  
The bq2011K measures the voltage differential between  
the SR and VSS pins. VOS (the offset voltage at the SR  
pin) is greatly affected by PC board layout. For optimal  
results, the PC board layout should follow the strict rule of  
a single-point ground return. Sharing high-current  
ground with small signal ground causes undesirable noise  
on the small signal nodes. Additionally:  
V
MCV = 2.00V  
The EDV threshold varies as a function of discharge cur-  
rent as follows:  
The capacitors (SB and VCC) should be placed as  
close as possible to the SB and VCC pins, respectively,  
and their paths to VSS should be as short as possible.  
A high-quality ceramic capacitor of 0.1µf is  
VSRO (mV)  
0 < VSRO 10  
10 < VSRO 20  
20 < VSRO 40  
40 < VSRO 60  
VSRO > 60  
VEDV (V)  
1.160  
1.124  
1.060  
0.960  
recommended for VCC  
.
The sense resistor (RS) should be as close as possible  
to the bq2011K.  
0 (OVLD)  
The R-C on the SR pin should be located as close as  
possible to the SR pin. The maximum R should not  
exceed 20K.  
Reset  
Reset can be accomplished with a command over the se-  
rial port as described on page 13.  
Gas Gauge Operation  
The operational overview diagram in Figure 2 illus-  
trates the operation of the bq2011K. The bq2011K accu-  
mulates a measure of charge and discharge currents, as  
well as an estimation of self-discharge. Charge currents  
are temperature and rate compensated, whereas self-  
discharge is only temperature compensated.  
Temperature  
The bq2011K internally determines the temperature in  
10°C steps centered from -35°C to +85°C. The tempera-  
ture steps are used to adapt charge and discharge rate  
compensations, self-discharge counting, and available  
charge display translation. The temperature range is  
available over the serial port in 10°C increments as  
shown below:  
The main counter, Nominal Available Charge (NAC),  
represents the available battery capacity at any given  
time. Battery charging increments the NAC register,  
while battery discharging and self-discharge decrement  
4
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