Electrical characteristics
STM8S003F3 STM8S003K3
Figure 42. ADC accuracy characteristics
E
G
1023
1022
1021
V
– V
DDA
SSA
1LSB
= ----------------------------------------
IDEAL
1024
(2)
E
T
(3)
7
6
5
4
3
2
1
(1)
E
O
E
L
E
D
1 LSB
IDEAL
0
1
2
3
4
5
6
7
1021102210231024
V
V
DDA
SSA
1. Example of an actual transfer curve.
2. The ideal transfer curve
3. End point correlation line
ET = Total unadjusted error: maximum deviation between the actual and the ideal transfer curves.
E
O = Offset error: deviation between the first actual transition and the first ideal one.
EG = Gain error: deviation between the last ideal transition and the last actual one.
ED = Differential linearity error: maximum deviation between actual steps and the ideal one.
EL = Integral linearity error: maximum deviation between any actual transition and the end point correlation
line.
Figure 43. Typical application with ADC
V
DD
STM8
V
T
0.6V
R
AIN
AINx
10-bit A/D
conversion
V
AIN
C
V
T
0.6V
AIN
I
C
ADC
L
1ꢀA
84/103
DocID018576 Rev 5
STMICROELECTRONICS [ ST ]
