Electrical characteristics
STM32F103xC, STM32F103xD, STM32F103xE
5.3.11
EMC characteristics
Susceptibility tests are performed on a sample basis during device characterization.
Functional EMS (electromagnetic susceptibility)
While a simple application is executed on the device (toggling 2 LEDs through I/O ports). the
device is stressed by two electromagnetic events until a failure occurs. The failure is
indicated by the LEDs:
●
●
Electrostatic discharge (ESD)
(positive and negative) is applied to all device pins until
a functional disturbance occurs. This test is compliant with the IEC 61000-4-2 standard.
FTB:
A Burst of Fast Transient voltage (positive and negative) is applied to V
DD
and
V
SS
through a 100 pF capacitor, until a functional disturbance occurs. This test is
compliant with the IEC 61000-4-4 standard.
A device reset allows normal operations to be resumed.
The test results are given in
They are based on the EMS levels and classes
defined in application note AN1709.
Table 41.
Symbol
EMS characteristics
Parameter
Conditions
Level/
Class
2B
V
FESD
V
DD
�½3.3
V, LQFP144, T
A
�½+25
°C,
Voltage limits to be applied on any I/O pin to
f
HCLK
�½72
MHz
induce a functional disturbance
conforms to IEC 61000-4-2
Fast transient voltage burst limits to be
applied through 100 pF on V
DD
and V
SS
pins to induce a functional disturbance
V
DD
�½3.3
V, LQFP144, T
A
�½+25
°C,
f
HCLK
�½72
MHz
conforms to IEC 61000-4-4
V
EFTB
4A
Designing hardened software to avoid noise problems
EMC characterization and optimization are performed at component level with a typical
application environment and simplified MCU software. It should be noted that good EMC
performance is highly dependent on the user application and the software in particular.
Therefore it is recommended that the user applies EMC software optimization and
prequalification tests in relation with the EMC level requested for his application.
Software recommendations
The software flowchart must include the management of runaway conditions such as:
●
●
●
Corrupted program counter
Unexpected reset
Critical Data corruption (control registers...)
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Doc ID 14611 Rev 7
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