STM32F100x4, STM32F100x6, STM32F100x8, STM32F100xB
Electromagnetic Interference (EMI)
Electrical characteristics
The electromagnetic field emitted by the device is monitored while a simple application is
executed (toggling 2 LEDs through the I/O ports). This emission test is compliant with
IEC 61967-2 standard which specifies the test board and the pin loading.
Table 30. EMI characteristics
Max vs. [fHSE/fHCLK
]
Monitored
frequency band
Symbol Parameter
Conditions
Unit
8/24 MHz
0.1 MHz to 30 MHz
30 MHz to 130 MHz
130 MHz to 1GHz
SAE EMI Level
9
17
16
4
VDD 3.3 V, TA 25°C,
LQFP100 package
compliant with
dBµV
-
SEMI
Peak level
IEC 61967-2
5.3.11
Absolute maximum ratings (electrical sensitivity)
Based on three different tests (ESD, LU) using specific measurement methods, the device is
stressed in order to determine its performance in terms of electrical sensitivity.
Electrostatic discharge (ESD)
Electrostatic discharges (a positive then a negative pulse separated by 1 second) are
applied to the pins of each sample according to each pin combination. The sample size
depends on the number of supply pins in the device (3 parts × (n+1) supply pins). This test
conforms to the JESD22-A114/C101 standard.
Table 31. ESD absolute maximum ratings
Maximum
Symbol
Ratings
Conditions
Class
Unit
value(1)
Electrostatic discharge
voltage (human body model) conforming to JESD22-A114
TA +25 °C
VESD(HBM)
2
II
TBD
V
Electrostatic discharge TA +25 °C
voltage (charge device model) conforming to JESD22-C101
VESD(CDM)
TBD
1. Based on characterization results, not tested in production.
Static latch-up
Two complementary static tests are required on six parts to assess the latch-up
performance:
●
A supply overvoltage is applied to each power supply pin
●
A current injection is applied to each input, output and configurable I/O pin
These tests are compliant with EIA/JESD78 IC latch-up standard.
Table 32. Electrical sensitivities
Symbol
Parameter
Conditions
Class
LU
Static latch-up class
TA +105 °C conforming to JESD78
TBD
Doc ID 16455 Rev 2
53/84
STMICROELECTRONICS [ ST ]
