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STM32F100C8T6BTR 参数 Datasheet PDF下载

STM32F100C8T6BTR图片预览
型号: STM32F100C8T6BTR
PDF下载: 下载PDF文件 查看货源
内容描述: 低和中等密度值线,先进的基于ARM的32位MCU低和中等密度值线,先进的基于ARM的32位MCU [Low & medium-density value line, advanced ARM-based 32-bit MCU Low & medium-density value line, advanced ARM-based 32-bit MCU]
分类和应用:
文件页数/大小: 84 页 / 1148 K
品牌: STMICROELECTRONICS [ ST ]
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STM32F100x4, STM32F100x6, STM32F100x8, STM32F100xB  
Electrical characteristics  
5.3.9  
Memory characteristics  
Flash memory  
The characteristics are given at T = –40 to 105 °C unless otherwise specified.  
A
Table 27. Flash memory characteristics  
Symbol  
Parameter  
Conditions  
Min(1) Typ Max(1) Unit  
tprog  
tERASE  
tME  
16-bit programming time  
Page (1 KB) erase time  
Mass erase time  
TA–40 to +105 °C  
TA –40 to +105 °C  
TA –40 to +105 °C  
40  
20  
20  
52.5  
70  
40  
40  
µs  
ms  
ms  
Read mode  
fHCLK = 24 MHz, VDD = 3.3 V  
20  
5
mA  
mA  
Write / Erase modes  
fHCLK = 24 MHz, VDD = 3.3 V  
IDD  
Supply current  
Power-down mode / Halt,  
VDD = 3.0 to 3.6 V  
50  
µA  
V
Vprog  
Programming voltage  
2
3.6  
1. Guaranteed by design, not tested in production.  
Table 28. Flash memory endurance and data retention  
Value  
Symbol  
Parameter  
Conditions  
Unit  
Min(1) Typ Max  
TA = –40 to +85 °C (6 suffix versions)  
TA = –40 to +105 °C (7 suffix versions)  
1 kcycle(2) at TA = 85 °C  
NEND  
Endurance  
kcycles  
Years  
10  
30  
10  
20  
tRET  
Data retention 1 kcycle(2) at TA = 105 °C  
10 kcycles(2) at TA = 55 °C  
1. Based on characterization not tested in production.  
2. Cycling performed over the whole temperature range.  
Doc ID 16455 Rev 2  
51/84  
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