STM32F105xx, STM32F107xx
Electrical characteristics
5.3.12
I/O current injection characteristics
As a general rule, current injection to the I/O pins, due to external voltage below V or
SS
above V (for standard, 3 V-capable I/O pins) should be avoided during normal product
DD
operation. However, in order to give an indication of the robustness of the microcontroller in
cases when abnormal injection accidentally happens, susceptibility tests are performed on a
sample basis during device characterization.
Functional susceptibilty to I/O current injection
While a simple application is executed on the device, the device is stressed by injecting
current into the I/O pins programmed in floating input mode. While current is injected into the
I/O pin, one at a time, the device is checked for functional failures.
The failure is indicated by an out of range parameter: ADC error above a certain limit (>5
LSB TUE), out of spec current injection on adjacent pins or other functional failure (for
example reset, oscillator frequency deviation).
The test results are given in Table 35
Table 35. I/O current injection susceptibility
Functional susceptibility
Symbol
Description
Unit
Negative
injection
Positive
injection
Injected current on OSC_IN32,
OSC_OUT32, PA4, PA5, PC13
-0
+0
IINJ
mA
Injected current on all FT pins
Injected current on any other pin
-5
-5
+0
+5
5.3.13
I/O port characteristics
General input/output characteristics
Unless otherwise specified, the parameters given in Table 36 are derived from tests
performed under the conditions summarized in Table 9. All I/Os are CMOS and TTL
compliant.
Table 36. I/O static characteristics
Symbol
Parameter
Conditions
Min
Typ
Max
Unit
Standard IO input low
level voltage
–0.3
0.28*(VDD-2 V)+0.8 V
0.32*(VDD-2V)+0.75 V
VDD+0.3
V
VIL
IO FT(1) input low level
voltage
–0.3
V
V
Standard IO input high
level voltage
0.41*(VDD-2 V)+1.3 V
VIH
IO FT(1) input high level
voltage
VDD > 2 V
5.5
5.2
0.42*(VDD-2 V)+1 V
V
VDD ≤ 2 V
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